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Test and design-for-test of mixed-signal integrated circuits

Published: 04 September 2004 Publication History

Abstract

This tutorial aims to introduce circuit designers into the problems of making integrated circuits more testable. An efficient test procedure for a complex, mixed-signal Application Specific Integrated Circuit (ASIC), must take several factors into consideration: stimuli generation, sufficient access, single test output, simple measurement set and system-level decomposition.These factors worth attention for specific circuits classes, since there is no universal method valid for any kind of analog and/or mixed-signal function. Attention will be paid to integrated filters and integrated analog-to-digital and digital-to-analog converters, as they are today the main analog and mixed-signal cores found in state-of-the-art complex Systems-on-Chip (SoCs). In particular, the possibilities offered by techniques using small circuit modifications will be specially focused, as the means to improve circuit testability, and thus the fault coverage, while avoiding at most to degrade the performance of the final electronic system. Practical silicon examples will be presented, trying to give a flavour on the pros and cons that design for test is offering nowadays to integrated circuit designers.To meet the goals stated above, the following topics are addressed in this tutorial: introduction to mixed-signal test (main test concepts, digital vs. analog testing, test practice in integrated circuit industry, design and test inter-relations), testing approaches (fault-based, specification-based, techniques for testing filters, techniques for testing converters), and design-for-test techniques (enhancing testability, built-in self-test and on-line test).This tutorial is intended to professionals interested in analog and mixed-signal integrated circuits in general: designers interested in how to consider test in early design phases, test engineers interested in incorporating test within the design flow, and academics involved in research and education on test procedures and strategies.

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  • (2016)Computer Based Teaching Methodology for Outcome-Based Engineering Education2016 IEEE 6th International Conference on Advanced Computing (IACC)10.1109/IACC.2016.154(809-814)Online publication date: Feb-2016
  • (2006)Integrating Robust Technologies for Mixed-Signal System Level Test2006 IEEE Symposium on Virtual Environments, Human-Computer Interfaces and Measurement Systems10.1109/VECIMS.2006.250798(92-95)Online publication date: Nov-2006
  • (2006)A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPsIEEE Design & Test10.1109/MDT.2006.5923:3(234-243)Online publication date: 1-May-2006
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cover image ACM Conferences
SBCCI '04: Proceedings of the 17th symposium on Integrated circuits and system design
September 2004
296 pages
ISBN:1581139470
DOI:10.1145/1016568
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

New York, NY, United States

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Published: 04 September 2004

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Cited By

View all
  • (2016)Computer Based Teaching Methodology for Outcome-Based Engineering Education2016 IEEE 6th International Conference on Advanced Computing (IACC)10.1109/IACC.2016.154(809-814)Online publication date: Feb-2016
  • (2006)Integrating Robust Technologies for Mixed-Signal System Level Test2006 IEEE Symposium on Virtual Environments, Human-Computer Interfaces and Measurement Systems10.1109/VECIMS.2006.250798(92-95)Online publication date: Nov-2006
  • (2006)A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPsIEEE Design & Test10.1109/MDT.2006.5923:3(234-243)Online publication date: 1-May-2006
  • (2006)Automated XML-based Test Modelling For Mixed-Signal Circuits2006 International Biennial Baltic Electronics Conference10.1109/BEC.2006.311098(1-2)Online publication date: Oct-2006

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