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View all- Ahmed BYouren WUllah RAhmed N(2012)A Novel TOPSIS-Based Test Vector Compaction Technique for Analog Fault DetectionJournal of Electronic Testing: Theory and Applications10.1007/s10836-012-5311-628:4(535-540)Online publication date: 1-Aug-2012
- Amaral JAmaral JTanscheit R(2006)An Immune Fault Detection System for Analog Circuits with Automatic Detector Generation2006 IEEE International Conference on Evolutionary Computation10.1109/CEC.2006.1688682(2966-2972)Online publication date: 2006
- Savioli CCzendrodi CCalvano JFilho A(2005)Fault-Trajectory Approach for Fault Diagnosis on Analog CircuitsProceedings of the conference on Design, Automation and Test in Europe - Volume 110.1109/DATE.2005.154(174-175)Online publication date: 7-Mar-2005