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Analytical models for leakage power estimation of memory array structures
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International Conference on Hardware Software Codesign archive
Proceedings of the 2nd IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis table of contents
Stockholm, Sweden
SESSION: Estimation and design techniques for energy-efficient memory systems table of contents
Pages: 146 - 151  
Year of Publication: 2004
ISBN:1-58113- 937-3
Authors
Mahesh Mamidipaka  University of California, Irvine, Irvine, CA
Kamal Khouri  Freescale/Motorola Inc., Austin, TX
Nikil Dutt  University of California, Irvine, Irvine, CA
Magdy Abadir  Freescale/Motorola Inc., Austin, TX
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
SIGBED: ACM Special Interest Group on Embedded Systems
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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ABSTRACT

There is a growing need for accurate power models at the system level. Memory structures such as caches, Branch Target Buffers (BTBs), and register files occupy significant area in contemporary SoC designs and are the main contributors to system leakage power dissipation. Existing models for leakage power estimation in array structures typically use coefficients derived from elaborate SPICE simulations. However, these methodologies are not applicable to array designs in a newer technology, that require power estimates early in the design cycle. In this paper, we propose analytical models for array structures that are based only on high level design parameters. Assuming typical circuit implementation styles, we identify the transistors that contribute to the leakage power in each array sub-circuit and develop models as a function of the operation (read/write/idle) on the array and organizational parameters of the array. The developed models are validated by comparing their estimates against the leakage power measured using SPICE simulations on industrial array designs belonging to the e5001 processor core. The comparison shows that the models are accurate with an error margin of less than 21.5% and thus can be used in high-level power-performance exploration. Interestingly, in array designs with dual threshold voltage technology, we observed that contrary to the general expectation, the array memory core contributes to just 9% and the address decoder contributes to as much as 62% of the total leakage power.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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M. Johnson et al. Models and Algorithms for Bounds on Leakage in CMOS Circuits. IEEE TCAD, 1999.
 
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Y. Zhang et al. Hotleakage: A Temperature-aware Model of Subthreshold and Gate Leakage for Architects. Technical Report CS-2003-05, Univ. of Virginia, March 2003.

Collaborative Colleagues:
Mahesh Mamidipaka: colleagues
Kamal Khouri: colleagues
Nikil Dutt: colleagues
Magdy Abadir: colleagues