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Multilevel full-chip routing with testability and yield enhancement

Published: 02 April 2005 Publication History

Abstract

We propose a multilevel full-chip routing algorithm that improves testability and diagnosability, manufacturability, and signal integrity for yield enhancement. Two major issues are addressed. (1) The oscillation ring (OR) test and its diagnosis scheme for interconnect based on the IEEE P1500 are integrated into the multilevel routing framework to achieve testability enhancement. (2) We present a heuristic to balance routing congestion to optimize the multiple-fault probability, chemical mechanic polishing (CMP) and optical proximity correction (OPC) induced manufacturability, and crosstalk effects, for yield improvement. Experimental results on the MCNC benchmark circuits show that the proposed OR method achieves 100% fault coverage and the maximal diagnosis resolution for interconnects, and the multilevel routing algorithm effectively balances the routing density to achieve 100% routing completion. Compared with [14], the experimental results show that our router improves the maximal congestion by 1.24X--6.11X in runtime speedup by 1.08X--7.66X, and improves the average congestion by 1.00X--4.52X with the improved congestion deviation by 1.37X--5.55X.

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A.B. Kahng, B. Liu, and I.I. Mandoiu, "Non-Tree Routing for Reliability and Yield Improvement," Proc. ICCAD, pp. 260--266, November, 2002.
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Cited By

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  • (2010)Dummy fill optimization for enhanced manufacturabilityProceedings of the 19th international symposium on Physical design10.1145/1735023.1735051(97-104)Online publication date: 14-Mar-2010
  • (2007)Recent Research and Emerging Challenges in Physical Design for Manufacturability/Reliability2007 Asia and South Pacific Design Automation Conference10.1109/ASPDAC.2007.357992(238-243)Online publication date: Jan-2007
  • (2007)Physical Design for System-On-A-ChipEssential Issues in SOC Design10.1007/1-4020-5352-5_9(311-403)Online publication date: 2007

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  1. Multilevel full-chip routing with testability and yield enhancement

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      cover image ACM Conferences
      SLIP '05: Proceedings of the 2005 international workshop on System level interconnect prediction
      April 2005
      114 pages
      ISBN:1595930337
      DOI:10.1145/1053355
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      Published: 02 April 2005

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      Author Tags

      1. multilevel routing
      2. testability
      3. yield

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      SLIP05: International Workshop on System Level Interconnect Prediction
      April 2 - 3, 2005
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      View all
      • (2010)Dummy fill optimization for enhanced manufacturabilityProceedings of the 19th international symposium on Physical design10.1145/1735023.1735051(97-104)Online publication date: 14-Mar-2010
      • (2007)Recent Research and Emerging Challenges in Physical Design for Manufacturability/Reliability2007 Asia and South Pacific Design Automation Conference10.1109/ASPDAC.2007.357992(238-243)Online publication date: Jan-2007
      • (2007)Physical Design for System-On-A-ChipEssential Issues in SOC Design10.1007/1-4020-5352-5_9(311-403)Online publication date: 2007

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