Article

Two dimensional reordering of functional test data for compression by ATE

Authors:

Hamidreza Hashempour,

Fabrizio LombardiAuthors Info & Claims

GLSVLSI '05: Proceedings of the 15th ACM Great Lakes symposium on VLSI

Pages 188 - 192

https://doi.org/10.1145/1057661.1057707

Published: 17 April 2005 Publication History

Abstract

This paper presents a novel approach for compressing functional test data in Automatic Test Equipment (ATE). A practical technique is presented for 2 Dimensional (2D) reordering of test data in which additionally to test vector reordering, column reordering is also applied. An ATE based approach to extract the original test vectors from the 2D ordered data is presented. The advantage of the approach is substantiated using the figure of merit of entropy for the 2D ordered test data of ISCAS benchmark circuits.

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Cited By

Mehta UDevashrayee NDasgupta K(2010)Hamming Distance Based 2-D Reordering with Power Efficient Don't Care Bit Filling: Optimizing the test data compression method2010 International Symposium on System on Chip10.1109/ISSOC.2010.5625560(1-7)Online publication date: Sep-2010
https://doi.org/10.1109/ISSOC.2010.5625560

Index Terms

Two dimensional reordering of functional test data for compression by ATE
1. Applied computing
  1. Physical sciences and engineering
    1. Engineering

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cover image ACM Conferences

GLSVLSI '05: Proceedings of the 15th ACM Great Lakes symposium on VLSI

April 2005

518 pages

ISBN:1595930574

DOI:10.1145/1057661

General Chair:
John Lach
University of Virginia
,
Program Chairs:
Gang Qu
University of Maryland, College Park
,
Yehea Ismail
Northwestern University

Copyright © 2005 ACM.

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Published: 17 April 2005

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GLSVLSI05: Great Lakes Symposium on VLSI 2005

April 17 - 19, 2005

Illinois, Chicago, USA

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Overall Acceptance Rate 312 of 1,156 submissions, 27%

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Cited By

Mehta UDevashrayee NDasgupta K(2010)Hamming Distance Based 2-D Reordering with Power Efficient Don't Care Bit Filling: Optimizing the test data compression method2010 International Symposium on System on Chip10.1109/ISSOC.2010.5625560(1-7)Online publication date: Sep-2010
https://doi.org/10.1109/ISSOC.2010.5625560

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