Article

An EFSM-based approach for functional ATPG

Authors:

Franco Fummi,

Cristina Marconcini,

Graziano PravadelliAuthors Info & Claims

GLSVLSI '05: Proceedings of the 15th ACM Great Lakes symposium on VLSI

Pages 197 - 200

https://doi.org/10.1145/1057661.1057709

Published: 17 April 2005 Publication History

Get Access

Abstract

This paper presents an EFSM-based approach for functional automatic test pattern generation (ATPG). It shows how a particular kind of extended FSM (EFSM) can be efficiently traversed by a pseudo-determinist ATPG to control and propagate faults for a functional description of a design. Functional ATPG on such EFSM models have been showed to be more efficient than the ATPG on the original design. However, test sequences generated on such an EFSM can lose their efficacy when simulated on the original description, since they may show some timing discrepancies. To solve this problem, this paper propose a strategy that manipulates the EFSM model.

References

[1]

D. Gajski, N. Dutt, S. Allen, C. Wu, and Y. Lin. High-Level Synthesis: Introduction to Chip and System Design. Kluwer Academic Publishers, first ed., 1992.

Digital Library

Google Scholar

[2]

F. Fummi, M. Boschini, X. Yu, and E. Rudnick. Sequential Circuit Test Generation Using a Symbolic/Genetic Hybrid Approach. Journal of Electronic Testing, vol. 17(3-4):pp. 321--330, 2001.

Digital Library

Google Scholar

[3]

K. Cheng and A. Krishnakumar. Automatic Generation of Functional Vectors Using the Extended Finite State Machine Model. ACM Trans. on Design Automation of Electronic Systems, vol. 1(1):pp. 57--79, 1996.

Digital Library

Google Scholar

[4]

U. Uyar and A. Duale. Modeling VHDL Specifications as Consistent EFSMs. In Proc. of IEEE MILCOM, pp. 740--744. 1997.

Google Scholar

[5]

U. Uyar and A. Duale. Resolving Inconsistencies in EFSM-Modeled Specifications. In Proc. of IEEE MILCOM, pp. 135--139. 1999.

Crossref

Google Scholar

[6]

F. Fummi, C. Marconcini, and G. Pravadelli. EFSM Manipulation to Increase High-Level ATPG Effectiveness. In Internal report, Uuniversita' di Verona, 2005.

Google Scholar

[7]

F. Fummi, C. Marconcini, and G. Pravadelli. Functional Verification based on the EFSM model. In roc. of IEEE HLDVT. pp. 69--74. 2004.

Digital Library

Google Scholar

[8]

F. Ferrandi, F. Fummi, L. Gerli, and D. Sciuto. Symbolic functional vector generation for VHDL specifications. In Proc. of IEEE DATE, pp. 442--446. 1999.

Digital Library

Google Scholar

[9]

R. Stallman and G. Sussman. Forward Reasoning and Dependency-Directed Backtracking in a System for Computer Aided Circuit Analysis. Artificial Intelligence, vol. 9:pp. 135--196, 1977.

Crossref

Google Scholar

[10]

M. Davis and H. Putnam. A Computing Procedure for Quantification Theory. Journal of the ACM, vol. 7(3):pp. 201--215, 1960.

Digital Library

Google Scholar

[11]

F. Fummi, C. Marconcini, and G. Pravadelli. Logic-level Mapping of High-level faults. INTEGRATION, the VLSI journal, pages 467--490, 2004.

Digital Library

Google Scholar

Cited By

View all

Fugate JStitt GMasna NDasgupta ABhunia SDorairaj NKehlet D(2023)An Exploration of ATPG Methods for Redacted IP and Reconfigurable Hardware2023 IEEE 41st VLSI Test Symposium (VTS)10.1109/VTS56346.2023.10139957(1-7)Online publication date: 24-Apr-2023
https://doi.org/10.1109/VTS56346.2023.10139957
Di Guglielmo GFummi FMarconcini CPravadelli G(2005)A Pseudo-Deterministic Functional ATPG based on EFSM TraversingProceedings of the Sixth International Workshop on Microprocessor Test and Verification10.1109/MTV.2005.1(70-75)Online publication date: 3-Nov-2005
https://dl.acm.org/doi/10.1109/MTV.2005.1

Index Terms

An EFSM-based approach for functional ATPG
1. Hardware
  1. Hardware test
  2. Robustness

Recommendations

Automated EFSM-based test case generation with scatter search
AST '12: Proceedings of the 7th International Workshop on Automation of Software Test

Extended Finite State Machine (EFSM) is widely-used to represent system specifications. Automated test data generation based on EFSM models is still a challenging task due to the complexity of transition paths. In this paper, we introduce a new approach ...
A CLP-Based Functional ATPG for Extended FSMs
MTV '07: Proceedings of the 2007 Eighth International Workshop on Microprocessor Test and Verification

It is a common opinion that semi-formal verification offers a good compromise between speed and exhaustiveness. In this context, the paper presents a semi-formal functional ATPG that joins static and dynamic techniques to generate high-quality test ...
An integrated search-based approach for automatic testing from extended finite state machine (EFSM) models

Context: The extended finite state machine (EFSM) is a modelling approach that has been used to represent a wide range of systems. When testing from an EFSM, it is normal to use a test criterion such as transition coverage. Such test criteria are often ...

Comments

Information & Contributors

Information

Published In

GLSVLSI '05: Proceedings of the 15th ACM Great Lakes symposium on VLSI

April 2005

518 pages

ISBN:1595930574

DOI:10.1145/1057661

General Chair:
John Lach
University of Virginia
,
Program Chairs:
Gang Qu
University of Maryland, College Park
,
Yehea Ismail
Northwestern University

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

Publisher

Association for Computing Machinery

New York, NY, United States

Publication History

Published: 17 April 2005

Permissions

Request permissions for this article.

Request Permissions

Check for updates

Author Tags

Qualifiers

Article

Conference

GLSVLSI05

Sponsor:

GLSVLSI05: Great Lakes Symposium on VLSI 2005

April 17 - 19, 2005

Illinois, Chicago, USA

Acceptance Rates

Overall Acceptance Rate 312 of 1,156 submissions, 27%

Upcoming Conference

GLSVLSI '25

Sponsor:
sigda

Great Lakes Symposium on VLSI 2025

June 30 - July 2, 2025

New Orleans , LA , USA

Contributors

Other Metrics

View Article Metrics

Bibliometrics & Citations

Bibliometrics

Article Metrics

2
Total Citations
View Citations
214
Total Downloads

Downloads (Last 12 months)4
Downloads (Last 6 weeks)0

Reflects downloads up to 07 Mar 2025

Other Metrics

View Author Metrics

Citations

Cited By

View all

Fugate JStitt GMasna NDasgupta ABhunia SDorairaj NKehlet D(2023)An Exploration of ATPG Methods for Redacted IP and Reconfigurable Hardware2023 IEEE 41st VLSI Test Symposium (VTS)10.1109/VTS56346.2023.10139957(1-7)Online publication date: 24-Apr-2023
https://doi.org/10.1109/VTS56346.2023.10139957
Di Guglielmo GFummi FMarconcini CPravadelli G(2005)A Pseudo-Deterministic Functional ATPG based on EFSM TraversingProceedings of the Sixth International Workshop on Microprocessor Test and Verification10.1109/MTV.2005.1(70-75)Online publication date: 3-Nov-2005
https://dl.acm.org/doi/10.1109/MTV.2005.1

View Options

Login options

Check if you have access through your login credentials or your institution to get full access on this article.

Full Access

Get this Publication

View options

PDF

View or Download as a PDF file.

PDF

eReader

View online with eReader.

eReader

Abstract

References

Cited By

Index Terms

Recommendations

Automated EFSM-based test case generation with scatter search

A CLP-Based Functional ATPG for Extended FSMs

An integrated search-based approach for automatic testing from extended finite state machine (EFSM) models

Comments

Information

Published In

Sponsors

Publisher

Publication History

Permissions

Check for updates

Author Tags

Qualifiers

Conference

Acceptance Rates

Upcoming Conference

Contributors

Other Metrics

Bibliometrics

Article Metrics

Other Metrics

Citations

Cited By

Login options

Full Access

View options

PDF

eReader

Share

Share this Publication link

Share on social media

Affiliations