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A new approach to the use of satisfiability in false path detection

Published: 17 April 2005 Publication History

Abstract

This paper presents a novel method for false path detection using satisfiability. It is based on circuit node properties that are related to non-testable stuck-at faults as well as to false path detection. When compared to traditional satisfiability methods that generate sat instances associated to paths, the proposed method is more efficient. This efficiency derives from the fact that most digital circuits have a number of nodes that is smaller than the number of paths.

References

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Larrabee, T., Test pattern generation using Boolean satisfiability, IEEE Transactions on CAD, Vol. 11, Issue: 1, January 1992, pp. 4--15.
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Ringe, M., Lindenkreuz, T., and Barke, E., Path verification using Boolean satisfiability, Design, Automation and Test in Europe, Feb. 1998, pp. 965--966.
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Brayton, R.K., Hachtel, G.D., McMullen, C.T., and Sangiovanni-Vincentelli, A.L.M., Logic Minimization Algorithms for VLSI Synthesis, Kluwer Academic Publishers, Boston, 1984.
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Fu, Z., Mahajan, Y., and Malik, S., zChaff Solver, http://www.princeton.edu/~chaff/zchaff.html
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Saldanha, A., Brayton, R.K., and Sangiovanni-Vincentelli, A.L.M., Circuit structure relations to redundancy and delay, IEEE Transactions on CAD, Vol. 13, issue 7, July 1994, pp. 875--883.
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Keutzer, K., Malik, S., and Saldanha, A., Is redundancy necessary to reduce delay?, IEEE Transactions on CAD, vol. 10, issue 4, 1991, pp. 453--469.

Cited By

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  • (2018)Finding False Paths for Sequential Circuits Using Operations on ROBDDs2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)10.1109/IOLTS.2018.8474213(240-242)Online publication date: Jul-2018
  • (2010)Improvements on the detection of false paths by using unateness and satisfiabilityProceedings of the 23rd symposium on Integrated circuits and system design10.1145/1854153.1854201(192-197)Online publication date: 6-Sep-2010
  • (2010)An efficient algorithm to verify generalized false pathsProceedings of the 47th Design Automation Conference10.1145/1837274.1837321(188-193)Online publication date: 13-Jun-2010
  • Show More Cited By

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  1. A new approach to the use of satisfiability in false path detection

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      cover image ACM Conferences
      GLSVLSI '05: Proceedings of the 15th ACM Great Lakes symposium on VLSI
      April 2005
      518 pages
      ISBN:1595930574
      DOI:10.1145/1057661
      • General Chair:
      • John Lach,
      • Program Chairs:
      • Gang Qu,
      • Yehea Ismail
      Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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      Published: 17 April 2005

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      Author Tags

      1. false paths
      2. satisfiability
      3. unateness

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      April 17 - 19, 2005
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      Overall Acceptance Rate 312 of 1,156 submissions, 27%

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      View all
      • (2018)Finding False Paths for Sequential Circuits Using Operations on ROBDDs2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)10.1109/IOLTS.2018.8474213(240-242)Online publication date: Jul-2018
      • (2010)Improvements on the detection of false paths by using unateness and satisfiabilityProceedings of the 23rd symposium on Integrated circuits and system design10.1145/1854153.1854201(192-197)Online publication date: 6-Sep-2010
      • (2010)An efficient algorithm to verify generalized false pathsProceedings of the 47th Design Automation Conference10.1145/1837274.1837321(188-193)Online publication date: 13-Jun-2010
      • (2010)Fast Monte Carlo estimation of timing yield with importance sampling and transistor-level circuit simulationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2010.204904229:9(1328-1341)Online publication date: 1-Sep-2010
      • (2010)Constraint analysis and debugging for multi-million instance SoC designs2010 11th International Symposium on Quality Electronic Design (ISQED)10.1109/ISQED.2010.5450540(422-427)Online publication date: Mar-2010

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