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Characterization of monotonic static CMOS gates in a 65nm technology

Published: 17 April 2005 Publication History

Abstract

This paper reviews the use of skewed monotonic static CMOS logic gates in scaled technologies where gate leakage currents become significant. High-level tradeoffs and synthesis approaches are discussed, and some experiments are constructed to evaluate the gate-level performance tradeoffs in a hypothetical standard 65nm CMOS technology. At the gate level, significant improvements in static power consumption are possible without reduction in evaluation delays, but the tradeoffs vary as the conditions and the amount of skewing are changed. NAND forms are still preferred as the gate leakage grows.

References

[1]
http://www-devices.eecs.berkeley.edu/
[2]
http://www.aimspice.com/
[3]
http://www.itrs.net, 2004 International Technology Roadmap for Semiconductors.
[4]
C. Kim, et. al., "Energy-efficient skewed static logic with dual Vt: design and synthesis," IEEE Trans. VLSI Systems, vol. 11, no. 1, Feb. 2003, pp. 64--70.
[5]
T. Thorp, et. al., "Design and Synthesis of Dynamic Circuits," IEEE Trans. VLSI Systems, vol. 11, no. 1, Feb. 2003, pp. 141--149.
[6]
P. Chin, et. al., "Characterization of Logic Circuit Techniques for High Leakage CMOS Technologies," in Proc. of ACM GLS-VLSI, 2004, pp. 230--235.

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  • (2019)Novel 3D Monotonic Characterization of Standard Cell Liberty File Attributes w.r.t ASIC Tool Flow2019 IEEE 62nd International Midwest Symposium on Circuits and Systems (MWSCAS)10.1109/MWSCAS.2019.8884936(227-230)Online publication date: Aug-2019
  • (2018)Novel 3D Monotonic Characterization of Standard Cell Liberty File Attributes w.r.t ASIC Tool Flow2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS)10.1109/MWSCAS.2018.8624015(771-774)Online publication date: Aug-2018
  • (2015)A web-based method for building and simulating standard cell circuits-A classroom applicationComputer Applications in Engineering Education10.1002/cae.2160023:2(304-313)Online publication date: 1-Mar-2015
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  1. Characterization of monotonic static CMOS gates in a 65nm technology

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    cover image ACM Conferences
    GLSVLSI '05: Proceedings of the 15th ACM Great Lakes symposium on VLSI
    April 2005
    518 pages
    ISBN:1595930574
    DOI:10.1145/1057661
    • General Chair:
    • John Lach,
    • Program Chairs:
    • Gang Qu,
    • Yehea Ismail
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    New York, NY, United States

    Publication History

    Published: 17 April 2005

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    Author Tags

    1. gate leakage reduction
    2. low power design

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    GLSVLSI05
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    GLSVLSI05: Great Lakes Symposium on VLSI 2005
    April 17 - 19, 2005
    Illinois, Chicago, USA

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    Overall Acceptance Rate 312 of 1,156 submissions, 27%

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    Cited By

    View all
    • (2019)Novel 3D Monotonic Characterization of Standard Cell Liberty File Attributes w.r.t ASIC Tool Flow2019 IEEE 62nd International Midwest Symposium on Circuits and Systems (MWSCAS)10.1109/MWSCAS.2019.8884936(227-230)Online publication date: Aug-2019
    • (2018)Novel 3D Monotonic Characterization of Standard Cell Liberty File Attributes w.r.t ASIC Tool Flow2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS)10.1109/MWSCAS.2018.8624015(771-774)Online publication date: Aug-2018
    • (2015)A web-based method for building and simulating standard cell circuits-A classroom applicationComputer Applications in Engineering Education10.1002/cae.2160023:2(304-313)Online publication date: 1-Mar-2015
    • (2013)Automatic generation of characterization circuits - An application in academia2013 IEEE Frontiers in Education Conference (FIE)10.1109/FIE.2013.6684909(661-664)Online publication date: Oct-2013
    • (2013)A collaborative platform for facilitating standard cell characterizationProceedings of the 2013 IEEE 17th International Conference on Computer Supported Cooperative Work in Design (CSCWD)10.1109/CSCWD.2013.6580963(202-206)Online publication date: Jun-2013
    • (2010)Characteristics of MS-CMOS logic in sub-32nm technologiesProceedings of the 20th symposium on Great lakes symposium on VLSI10.1145/1785481.1785572(393-396)Online publication date: 16-May-2010
    • (2006)Monotonic static CMOS tradeoffs in sub-100nm technologiesProceedings of the 16th ACM Great Lakes symposium on VLSI10.1145/1127908.1127973(278-283)Online publication date: 30-Apr-2006
    • (2006)A Low-Leakage High-Speed Monotonic Static CMOS 64b Adder in a Dual Gate Oxide 65-nm CMOS TechnologyProceedings of the 7th International Symposium on Quality Electronic Design10.1109/ISQED.2006.12(312-317)Online publication date: 27-Mar-2006

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