skip to main content
article

Routing-aware scan chain ordering

Published: 01 July 2005 Publication History

Abstract

Scan chain insertion can have a large impact on routability, wirelength, and timing of the design. We present a routing-driven methodology for scan chain ordering with minimum wirelength objective. A routing-based approach to scan chain ordering, while potentially more accurate, can result in TSP (Traveling Salesman Problem) instances which are asymmetric and highly nonmetric; this may require a careful choice of solvers. We evaluate our new methodology on recent industry place-and-route blocks with 1200 to 5000 scan cells. We show substantial wirelength reductions for the routing-based flow versus the traditional placement-based flow. In a number of our test cases, over 86% of scan routing overhead is saved. Even though our experiments are, so far, timing oblivious, the routing-based flow also improves evaluated timing, and practical timing-driven extensions appear feasible.

References

[1]
Barbagello, S., Bodoni, M. L., Medina, D., Corno, F., Prinetto, P., and Reorda, M. S. 1996. Scan-insertion criteria for low design impact. In Proceedings of VLSI Test Symposium. 26--31.
[2]
Bentley, J. J. 1992. Fast algorithms for geometric traveling problems. ORSA J. Comput. 4, 4, 387--410.
[3]
Boese, K. D., Kahng, A. B., and Tsay, R. S. 1994. Scan chain optimization: Heuristic and optimal solutions. Internal rep. UCLA Computer Science Dept. (Oct.). Available at http://www.gigascale.org/bookshelf/Slots/ScanOpt/.
[4]
Feuer, M. and Koo, C. C. 1983. Method for rechaining shift register latches which contain more than one physical book. IBM Tech. Disclos. Bull. 25, 9, 4818--4820.
[5]
Gupta, P., Kahng, A. B., and Mantik, S. 2003. A proposal for routing-based timing-driven scan chain ordering. In Proceedings of the IEEE International Symposium on Quality Electronic Design (March). To appear.
[6]
Helsgaun, K. 2000. An effective implementation of the Lin-Kernighan traveling salesman heuristic. European J. Operat. Res. 12, 106--130. The code is available at http://www.dat. ruc.dk/keld/research/LKH/.
[7]
Hirech, M., Beausang, J., and Gu, X. 1998. A new approach to scan chain reordering using physical design information. In Proceedings of the International Test Conference. 348--355.
[8]
Hong, I., Kahng, A. B., and Moon, B. R. 1997. Improved large-step markov chain variants for the symmetric TSP. J. Heurist. 3, 1, 63--81.
[9]
Johnson, D. S 1990. Local optimization and the traveling salesman problem. In Proceedings of the 17th International Colloquium on Automata, Languages and Programming. 446--460.
[10]
Johnson, D. S. and McGeoch, L. A. 1997. The traveling salesman problem: A case study in local optimization. In E. H. L. Aarts and J. K. Lenstra Eds. Local Search Algorithms, John Wiley and Sons, New York, NY.
[11]
Johnson, D. S., Gutin, G., McGeoch, L. A., Yeo, A., Zhang, W., and Zverovitch, A. 2002. Experimental analysis of heuristics for the ATSP. The Traveling Salesman and its Variations. Kluwer Academic Publishers. To appear.
[12]
Kahng, A. B. and Mantik, S. 2000. On mismatches between incremental optimizers and instance perturbations in physical design tools. In Proceedings of the IEEE/ACM International Conference on Computer-Aided Design. (Nov.), 17--21.
[13]
Kanellakis, P. C. and Papadimitriou, C. H. 1992. Local search for the asymmetric traveling salesman problem. Operat. Res. Letters 11, 219--224.
[14]
Kobayashi, S., Edahiro, M., and Kubo, M. 1999. A VLSI scan-chain optimization algorithm for multiple scan-paths. IEICE Transaction Fundamentals E82-A(11), 2499--2504.
[15]
Lawler, E. L., Lenstra, J. K., Rinnooy-Kan, A., and Shmoys, D. 1985. The Traveling Salesman Problem: A Guided Tour of Combinatorial Optimization, John Wiley and Sons, New York, NY.
[16]
Lin, K.-H., Chen, C.-S., and Hwang, T. T. 1996. Layout driven chaining of scan flip-flops. In IEE Comput. Digit. Techn. 143, 6, 421--425.
[17]
Makar, S. 1998. A layout based approach for ordering scan chain flip-flops. In Proceedings of the International Test Conference. 341--347.
[18]
Martin, O., Otto, S. W., and Felten, E. W. 1991. Large-step Markov chains for the traveling salesman problem. Complex Syst. 5, 3, 299--326.
[19]
Miller, D. L. and Pekny, J. F. 1991. Exact solution of large asymmetric traveling salesman problems. Science 251, 15 (Feb.), 754--761.
[20]
Reinelt, G. 1992. Fast heuristics for large geometric traveling salesman problems. ORSA J. Comput. 4, 2, 206--217.
[21]
Zhang, W. 1992. On the expected complexity of the traveling salesman problem under subtour elimination. UCLA Computer Science Dept. Tech. Rep. CSD-920022.

Cited By

View all
  • (2012)A graph-based approach to optimal scan chain stitching using RTL design descriptionsVLSI Design10.1155/2012/3128082012(3-3)Online publication date: 1-Jan-2012
  • (2012)Instance-specific multi-objective parameter tuning based on fuzzy logicEuropean Journal of Operational Research10.1016/j.ejor.2011.10.024218:2(305-315)Online publication date: Apr-2012
  • (2011)Scan chain configuration method for broadcast decompressor architectureProceedings of the 2011 12th Latin American Test Workshop10.1109/LATW.2011.5985913(1-5)Online publication date: 27-Mar-2011
  • Show More Cited By

Recommendations

Comments

Information & Contributors

Information

Published In

cover image ACM Transactions on Design Automation of Electronic Systems
ACM Transactions on Design Automation of Electronic Systems  Volume 10, Issue 3
July 2005
156 pages
ISSN:1084-4309
EISSN:1557-7309
DOI:10.1145/1080334
Issue’s Table of Contents
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

Publisher

Association for Computing Machinery

New York, NY, United States

Journal Family

Publication History

Published: 01 July 2005
Published in TODAES Volume 10, Issue 3

Permissions

Request permissions for this article.

Check for updates

Author Tags

  1. Layout
  2. scan chain
  3. testing

Qualifiers

  • Article

Contributors

Other Metrics

Bibliometrics & Citations

Bibliometrics

Article Metrics

  • Downloads (Last 12 months)4
  • Downloads (Last 6 weeks)1
Reflects downloads up to 14 Feb 2025

Other Metrics

Citations

Cited By

View all
  • (2012)A graph-based approach to optimal scan chain stitching using RTL design descriptionsVLSI Design10.1155/2012/3128082012(3-3)Online publication date: 1-Jan-2012
  • (2012)Instance-specific multi-objective parameter tuning based on fuzzy logicEuropean Journal of Operational Research10.1016/j.ejor.2011.10.024218:2(305-315)Online publication date: Apr-2012
  • (2011)Scan chain configuration method for broadcast decompressor architectureProceedings of the 2011 12th Latin American Test Workshop10.1109/LATW.2011.5985913(1-5)Online publication date: 27-Mar-2011
  • (2011)Advanced scan chain configuration method for broadcast decompressor architectureProceedings of the 2011 9th East-West Design&Test Symposium10.1109/EWDTS.2011.6116609(140-143)Online publication date: 9-Sep-2011
  • (2010)On Reducing Test Power, Volume and Routing Cost by Chain Reordering and Test Compression TechniquesIEICE Transactions on Electronics10.1587/transele.E93.C.369E93-C:3(369-378)Online publication date: 2010
  • (2009)Low-power scan testing for test data compression using a routing-driven scan architectureIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2009.201877528:7(1101-1105)Online publication date: 1-Jul-2009
  • (2009)Cache-aware optimization of BAN applicationsDesign Automation for Embedded Systems10.1007/s10617-009-9045-313:3(159-178)Online publication date: 1-Sep-2009
  • (2008)Cache-aware optimization of BAN applicationsProceedings of the 6th IEEE/ACM/IFIP international conference on Hardware/Software codesign and system synthesis10.1145/1450135.1450170(149-154)Online publication date: 19-Oct-2008
  • (2008)A Partitioning Based Physical Scan Chain Allocation Algorithm that Minimizes Voltage Domain CrossingsProceedings of the 21st International Conference on VLSI Design10.1109/VLSI.2008.46(187-193)Online publication date: 4-Jan-2008
  • (2008)Worst case analysis of Max-Regret, Greedy and other heuristics for Multidimensional Assignment and Traveling Salesman ProblemsJournal of Heuristics10.1007/s10732-007-9033-314:2(169-181)Online publication date: 1-Apr-2008

View Options

Login options

Full Access

View options

PDF

View or Download as a PDF file.

PDF

eReader

View online with eReader.

eReader

Figures

Tables

Media

Share

Share

Share this Publication link

Share on social media