EMC-EMI optimized high speed CAN line driver

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EMC-EMI optimized high speed CAN line driver

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SBCCI archive
Proceedings of the 18th annual symposium on Integrated circuits and system design table of contents

Florianolpolis, Brazil

SESSION: Networks-on-chip and IC design table of contents

Pages: 9 - 14

Year of Publication: 2005

ISBN:1-59593-174-0

Authors

Armando Gomes	Freescale Semiconductors, Jaguariuna, Brazil
Edevaldo Pereira S., Júnior	Freescale Semiconductors, Jaguariuna, Brazil
Ivan Nascimento	Freescale Semiconductors, Jaguariuna, Brazil

Sponsors

SIGDA: ACM Special Interest Group on Design Automation
ACM: Association for Computing Machinery

Publisher

ACM New York, NY, USA

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ABSTRACT

This paper presents the design techniques employed to minimize the irradiated noise emissions of a High Speed Controller Area Network (HSCAN) line driver targeted for automotive and industrial applications. Tradeoffs between this and other architectural approaches are presented, focusing on improved emissions without reducing robustness to EMI aggressions. This approach resulted in a complete CAN interface that does not require discrete filters or RF-chokes, lowering implementation costs while improving performance. The interface was successfully implemented in a 0.8u BCD technology and experimental results are discussed. Finally, possible developments over the derived techniques are presented.

REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

	1	ISO11898-2:2003 Controller Area Network (CAN) - Part 2: High-Speed medium access unit.
	2	CAN Specification Version 2.0B - 1991, Robert Bosch GmbH
	3	David P. Laude - Ford Microelectronics Inc, IC Design Considerations For The Harsh Automotive Electrical Environment - IEEE 1994 Custom Integrated Circuits Conference
	4	A. Lechner, D. Draxelmayr, H. Irmer, H. Zitta and J. Melbert - Siemens AG Munchen Germany, Dedicated Protective Functions of Automotive ICs and Design Examples - IEEE 1994 Custom Integrated Circuits Conference
	5	ISO 7637-3:1995 Road-Vehicles - Electrical disturbances by conduction and coupling
	6	ISO 11452-4:1993 Road Vehicles - Electrical disturbances by narrow-band radiated electromagnetic energy - component test methods. Part 4:Bulk Current Injection - BCI.
	7	J.G.Melbert, Siemens Semiconductor Munich Germany - Next Generation Automotive Electronics: The Impact on Technologies and Design Methodologies - IEEE 1992 Symposium on VLSI Circuits Digest of Technical Papers
	8	Ross Bannatyne - Motorola Transportations Systems Group, Austin, TX - Semiconductors Development for Automotive Systems
	9	SAE J1213 - Electromagnetic susceptibility measurements procedures for vehicle components.
	10	AEC - Q100 - Rev-F July 18, 2003 Stress test qualification for Integrated Circuits.