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Effects of information layout, screen size, and field of view on user performance in information-rich virtual environments
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Source Virtual Reality Software and Technology archive
Proceedings of the ACM symposium on Virtual reality software and technology table of contents
Monterey, CA, USA
SESSION: Human performance in virtual spaces table of contents
Pages: 46 - 55  
Year of Publication: 2005
ISBN:1-59593-098-1
Authors
Nicholas F. Polys  Virginia Polytechnic Institute and State University
Seonho Kim  Virginia Polytechnic Institute and State University
Doug A. Bowman  Virginia Polytechnic Institute and State University
Sponsors
SIGCHI: ACM Special Interest Group on Computer-Human Interaction
SIGGRAPH: ACM Special Interest Group on Computer Graphics and Interactive Techniques
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 12,   Downloads (12 Months): 138,   Citation Count: 5
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ABSTRACT

This paper describes our recent experimental evaluation of Information-Rich Virtual Environment (IRVE) interfaces. To explore the depth cue/visibility tradeoff between annotation schemes, we design and evaluate two information layout techniques to support search and comparison tasks. The techniques provide different depth and association cues between objects and their labels: labels were displayed either in the virtual world relative to their referent (Object Space) or on an image plane workspace (Viewport Space). The Software Field of View (SFOV) was controlled to 60 or 100 degrees of vertical angle and two groups were tested: those running on a single monitor and those on a tiled nine-panel display. Users were timed, tracked for correctness, and gave ratings for both difficulty and satisfaction on each task. Significant advantages were found for the Viewport interface, and for high SFOV. The interactions between these variables suggest special design considerations to effectively support search and comparison performance across monitor configurations and projection distortions.


REFERENCES

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Collaborative Colleagues:
Nicholas F. Polys: colleagues
Seonho Kim: colleagues
Doug A. Bowman: colleagues