| Automatic test factoring for java |
| Full text |
Pdf
(292 KB)
|
| Source
|
Automated Software Engineering
archive
Proceedings of the 20th IEEE/ACM international Conference on Automated software engineering
table of contents
Long Beach, CA, USA
SESSION: Testing I
table of contents
Pages: 114 - 123
Year of Publication: 2005
ISBN:1-59593-993-4
|
|
Authors
|
|
David Saff
|
MIT Computer Science and Artificial Intelligence Lab, Cambridge, MA
|
|
Shay Artzi
|
MIT Computer Science and Artificial Intelligence Lab, Cambridge, MA
|
|
Jeff H. Perkins
|
MIT Computer Science and Artificial Intelligence Lab, Cambridge, MA
|
|
Michael D. Ernst
|
MIT Computer Science and Artificial Intelligence Lab, Cambridge, MA
|
|
| Sponsors |
|
| Publisher |
|
| Bibliometrics |
Downloads (6 Weeks): 4, Downloads (12 Months): 62, Citation Count: 14
|
|
|
ABSTRACT
Test factoring creates fast, focused unit tests from slow system-wide tests; each new unit test exercises only a subset of the functionality exercised by the system test. Augmenting a test suite with factored unit tests should catch errors earlier in a test run.One way to factor a test is to introduce mock objects. If a test exercises a component T, which interacts with another component E (the "environment"), the implementation of E can be replaced by a mock. The mock checks that T's calls to E are as expected, and it simulates E's behavior in response. We introduce an automatic technique for test factoring. Given a system test for T and E, and a record of T's and E's behavior when the system test is run, test factoring generates unit tests for T in which E is mocked. The factored tests can isolate bugs in T from bugs in E and, if E is slow or expensive, improve test performance or cost.Our implementation of automatic dynamic test factoring for the Java language reduces the running time of a system test suite by up to an order of magnitude.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
| |
1
|
|
 |
2
|
Michael Factor , Assaf Schuster , Konstantin Shagin, Instrumentation of standard libraries in object-oriented languages: the twin class hierarchy approach, Proceedings of the 19th annual ACM SIGPLAN conference on Object-oriented programming, systems, languages, and applications, October 24-28, 2004, Vancouver, BC, Canada
|
| |
3
|
|
| |
4
|
|
 |
5
|
|
| |
6
|
H. K. N. Leung and L. White. Insights into regression testing. In ICSM, pages 60--69, Oct. 1989.
|
 |
7
|
|
 |
8
|
Thomas Ostrand , Aaron Anodide , Herbert Foster , Tarak Goradia, A visual test development environment for GUI systems, Proceedings of the 1998 ACM SIGSOFT international symposium on Software testing and analysis, p.82-92, March 02-04, 1998, Clearwater Beach, Florida, United States
|
| |
9
|
Rational Robot. http://www-306.ibm.com/software/awdtools/tester/robot/.
|
| |
10
|
|
| |
11
|
|
| |
12
|
|
 |
13
|
|
| |
14
|
D. Saff and M. D. Ernst. Continuous testing in Eclipse. In 2nd Eclipse Technology Exchange Workshop (eTX), Barcelona, Spain, Mar. 2004.
|
| |
15
|
SilkTest. http://www.segue.com/products/functional-regressional-testing/silktest.asp.
|
 |
16
|
|
| |
17
|
Mercury WinRunner. http://www.mercury.com/us/products/quality-center/functional-testing/winrunner/.
|
| |
18
|
|
CITED BY 14
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Philip J. Guo , Jeff H. Perkins , Stephen McCamant , Michael D. Ernst, Dynamic inference of abstract types, Proceedings of the 2006 international symposium on Software testing and analysis, July 17-20, 2006, Portland, Maine, USA
|
|
Sebastian Elbaum , Hui Nee Chin , Matthew B. Dwyer , Jonathan Dokulil, Carving differential unit test cases from system test cases, Proceedings of the 14th ACM SIGSOFT international symposium on Foundations of software engineering, November 05-11, 2006, Portland, Oregon, USA
|
|
|
|
|