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Automatic test factoring for java
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Proceedings of the 20th IEEE/ACM international Conference on Automated software engineering table of contents
Long Beach, CA, USA
SESSION: Testing I table of contents
Pages: 114 - 123  
Year of Publication: 2005
ISBN:1-59593-993-4
Authors
David Saff  MIT Computer Science and Artificial Intelligence Lab, Cambridge, MA
Shay Artzi  MIT Computer Science and Artificial Intelligence Lab, Cambridge, MA
Jeff H. Perkins  MIT Computer Science and Artificial Intelligence Lab, Cambridge, MA
Michael D. Ernst  MIT Computer Science and Artificial Intelligence Lab, Cambridge, MA
Sponsors
ACM: Association for Computing Machinery
SIGART: ACM Special Interest Group on Artificial Intelligence
SIGSOFT: ACM Special Interest Group on Software Engineering
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 4,   Downloads (12 Months): 62,   Citation Count: 14
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ABSTRACT

Test factoring creates fast, focused unit tests from slow system-wide tests; each new unit test exercises only a subset of the functionality exercised by the system test. Augmenting a test suite with factored unit tests should catch errors earlier in a test run.One way to factor a test is to introduce mock objects. If a test exercises a component T, which interacts with another component E (the "environment"), the implementation of E can be replaced by a mock. The mock checks that T's calls to E are as expected, and it simulates E's behavior in response. We introduce an automatic technique for test factoring. Given a system test for T and E, and a record of T's and E's behavior when the system test is run, test factoring generates unit tests for T in which E is mocked. The factored tests can isolate bugs in T from bugs in E and, if E is slow or expensive, improve test performance or cost.Our implementation of automatic dynamic test factoring for the Java language reduces the running time of a system test suite by up to an order of magnitude.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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H. K. N. Leung and L. White. Insights into regression testing. In ICSM, pages 60--69, Oct. 1989.
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Rational Robot. http://www-306.ibm.com/software/awdtools/tester/robot/.
 
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D. Saff and M. D. Ernst. Continuous testing in Eclipse. In 2nd Eclipse Technology Exchange Workshop (eTX), Barcelona, Spain, Mar. 2004.
 
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SilkTest. http://www.segue.com/products/functional-regressional-testing/silktest.asp.
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Mercury WinRunner. http://www.mercury.com/us/products/quality-center/functional-testing/winrunner/.
 
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CITED BY  14
 
 
 

Collaborative Colleagues:
David Saff: colleagues
Shay Artzi: colleagues
Jeff H. Perkins: colleagues
Michael D. Ernst: colleagues