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Statistical design and optimization of SRAM cell for yield enhancement

Published: 07 November 2004 Publication History

Abstract

We have analyzed and modeled the failure probabilities of SRAM cells due to process parameter variations. A method to predict the yield of a memory chip based on the cell failure probability is proposed. The developed method is used in an early stage of a design cycle to minimize memory failure probability by statistically sizing of SRAM cell.

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  1. Statistical design and optimization of SRAM cell for yield enhancement

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      cover image ACM Conferences
      ICCAD '04: Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
      November 2004
      913 pages
      ISBN:0780387023

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      IEEE Computer Society

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      Published: 07 November 2004

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      • (2024)A Robust and Energy Efficient Hyperdimensional Computing System for Voltage-scaled CircuitsACM Transactions on Embedded Computing Systems10.1145/362067123:6(1-20)Online publication date: 11-Sep-2024
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      • (2016)Statistical Rare-Event Analysis and Parameter Guidance by Elite Learning Sample SelectionACM Transactions on Design Automation of Electronic Systems10.1145/287542221:4(1-21)Online publication date: 27-May-2016
      • (2015)AuthenticacheProceedings of the 48th International Symposium on Microarchitecture10.1145/2830772.2830814(128-140)Online publication date: 5-Dec-2015
      • (2014)Using ECC Feedback to Guide Voltage Speculation in Low-Voltage ProcessorsProceedings of the 47th Annual IEEE/ACM International Symposium on Microarchitecture10.1109/MICRO.2014.54(306-318)Online publication date: 13-Dec-2014
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      • (2011)Efficient SRAM failure rate prediction via Gibbs samplingProceedings of the 48th Design Automation Conference10.1145/2024724.2024769(200-205)Online publication date: 5-Jun-2011
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      • (2010)Reducing SRAM power using fine-grained wordline pulsewidth controlIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2009.201251118:3(356-364)Online publication date: 1-Mar-2010
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