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- Youhua Shi Nozomu Togawa Masao Yanagisawa Tatsuo Ohtsuki (2008)GECOM: Test data compression combined with all unknown response masking2008 Asia and South Pacific Design Automation Conference10.1109/ASPDAC.2008.4484018(577-582)Online publication date: Jan-2008
- Lin CChen HGielen G(2007)A selective pattern-compression scheme for power and test-data reductionProceedings of the 2007 IEEE/ACM international conference on Computer-aided design10.5555/1326073.1326180(520-525)Online publication date: 5-Nov-2007
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