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A new test and characterization scheme for 10+ GHz low jitter wide band PLL

Published: 24 January 2006 Publication History

Abstract

This paper presents a new test and characterization scheme for 10+ GHz low jitter wide band PLL in 90 nm partially depleted (PD) Silicon-On-Insulator (SOI) CMOS technology. We measure the frequency range of VCOs without adding any devices for test between charge-pump (CP) and voltage- controlled oscillator (VCO). That test scheme gives us the intermediate frequency of VCO as well as the maximum and the minimum frequency. This paper also describes circuitry to observe the duty cycle of 4.2GHz clock directly on a wafer probe station, including a method to verify the measured duty cycle.

Reference

[1]
D. Boerstler, K. Miki, E. Hailu, H. Kihara, E. Lukes, S. Pettengill, J. Qi, J. Strom and M. Yoshida: "A 10+ GHz Low Jitter Wide Band PLL in 90 nm PD SOI CMOS Technology," Symposium on VLSI Circuits Digest of Technical Papers, pp.228--231, 2004

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  1. A new test and characterization scheme for 10+ GHz low jitter wide band PLL

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          cover image ACM Conferences
          ASP-DAC '06: Proceedings of the 2006 Asia and South Pacific Design Automation Conference
          January 2006
          998 pages
          ISBN:0780394518

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          • IEEE Circuits and Systems Society
          • SIGDA: ACM Special Interest Group on Design Automation
          • IEICE ESS: Institute of Electronics, Information and Communication Engineers, Engineering Sciences Society
          • IPSJ SIG-SLDM: Information Processing Society of Japan, SIG System LSI Design Methodology

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          IEEE Press

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          Published: 24 January 2006

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