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Convergence-provable statistical timing analysis with level-sensitive latches and feedback loops

Published: 24 January 2006 Publication History

Abstract

Statistical timing analysis has been widely applied to predict the timing yield of VLSI circuits when process variations become significant. Existing statistical latch timing methods are either having exponential complexity or unable to treat the random variable's self-dependence caused by the coexistence of level-sensitive latches and feedback loops.In this paper, an efficient iterative statistical timing algorithm with provable convergence is proposed for latch-based circuits with feedback loops. Based on a new notion of iteration mean, we prove that the algorithm converges unconditionally. Moreover, we show that the converged value of iteration mean can be used to predict the circuit yield during design time. Tested by ISCAS'89 benchmark circuits, the proposed algorithm shows an error of 1.1% and speedup of 303 x on average when compared with the Monte Carlo simulation.

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Cited By

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  • (2022)A Scalable, Memory-Efficient Algorithm for Minimum Cycle Mean Calculation in Directed GraphsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2021.309730041:6(1943-1956)Online publication date: Jun-2022
  • (2018)SoftCorner: Relaxation of Corner Values for De-terministic Static Timing Analysis of VLSI Sys-temsIEEE Access10.1109/ACCESS.2018.2875474(1-1)Online publication date: 2018
  • (2011)Binning Optimization for Transparently-Latched CircuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2010.208187030:2(270-283)Online publication date: 1-Feb-2011
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  1. Convergence-provable statistical timing analysis with level-sensitive latches and feedback loops

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        cover image ACM Conferences
        ASP-DAC '06: Proceedings of the 2006 Asia and South Pacific Design Automation Conference
        January 2006
        998 pages
        ISBN:0780394518

        Sponsors

        • IEEE Circuits and Systems Society
        • SIGDA: ACM Special Interest Group on Design Automation
        • IEICE ESS: Institute of Electronics, Information and Communication Engineers, Engineering Sciences Society
        • IPSJ SIG-SLDM: Information Processing Society of Japan, SIG System LSI Design Methodology

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        IEEE Press

        Publication History

        Published: 24 January 2006

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        View all
        • (2022)A Scalable, Memory-Efficient Algorithm for Minimum Cycle Mean Calculation in Directed GraphsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2021.309730041:6(1943-1956)Online publication date: Jun-2022
        • (2018)SoftCorner: Relaxation of Corner Values for De-terministic Static Timing Analysis of VLSI Sys-temsIEEE Access10.1109/ACCESS.2018.2875474(1-1)Online publication date: 2018
        • (2011)Binning Optimization for Transparently-Latched CircuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2010.208187030:2(270-283)Online publication date: 1-Feb-2011
        • (2011)Methods of Parameter VariationsProcess Variations and Probabilistic Integrated Circuit Design10.1007/978-1-4419-6621-6_4(91-179)Online publication date: 8-Oct-2011
        • (2010)Fast statistical timing analysis of latch-controlled circuits for arbitrary clock periodsProceedings of the International Conference on Computer-Aided Design10.5555/2133429.2133540(524-531)Online publication date: 7-Nov-2010
        • (2010)Statistical timing verification for transparently latched circuits through structural graph traversalProceedings of the 2010 Asia and South Pacific Design Automation Conference10.5555/1899721.1899877(663-668)Online publication date: 18-Jan-2010
        • (2010)Fast statistical timing analysis of latch-controlled circuits for arbitrary clock periods2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)10.1109/ICCAD.2010.5653800(524-531)Online publication date: Nov-2010
        • (2009)Timing model extraction for sequential circuits considering process variationsProceedings of the 2009 International Conference on Computer-Aided Design10.1145/1687399.1687463(336-343)Online publication date: 2-Nov-2009
        • (2009)Binning optimization based on SSTA for transparently-latched circuitsProceedings of the 2009 International Conference on Computer-Aided Design10.1145/1687399.1687462(328-335)Online publication date: 2-Nov-2009
        • (2008)Statistical Timing AnalysisIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2007.90704727:4(589-607)Online publication date: 1-Apr-2008

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