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A perturbation-aware noise convergence methodology for high frequency microprocessors
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Source with EDA Technofair Design Automation Conference Asia and South Pacific archive
Proceedings of the 2005 conference on Asia South Pacific design automation table of contents
Shanghai, China
SESSION: Crosstalk noise avoidance and power/ground network optimization table of contents
Pages: 717 - 722  
Year of Publication: 2005
ISBN:0-7803-8737-6
Authors
Prashant Saxena  Intel Corporation, Hillsboro OR
Kumar N. Lalgudi  Intel Corporation, Hillsboro OR
Hans J. Greub  Intel Corporation, Hillsboro OR
Janet M. Wang-Roveda  University of Arizona, Tucson AZ
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
: Shanghai IC Industry Association
: IEEE SSCS Shanghai Chapter
: IEEE CAS
: IEEE Beijing Section
: Fudan University
: Chinese Institute of Electronics
Publisher
ACM  New York, NY, USA
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ABSTRACT

We present a practical flow that automates the process of analyzing noise failures and determining and implementing the most appropriate design fixes in high performance designs. For each noise problem, the flow implicitly identifies the most sensitive relevant electrical parameter(s) which it then maps to a physical solution that minimizes design perturbation. Integrated with standard physical synthesis, it was used extensively in a high volume 90 nm multi-GHz microprocessor project.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Gal, L., On-chip crosstalk -- The new signal integrity challenge, CICC, pp. 12.1.1--12.1.4, 1995.
 
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Saxena, P., and Gupta, S., On integrating power and signal routing for shield count minimization in congested regions, IEEE Trans. CAD 22(4), pp. 437--445, Apr. 2003.
 
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Saxena, P., and Liu, C. L., A postprocessing algorithm for crosstalk-driven wire perturbation, in IEEE Trans. CAD 19(6), pp. 691--702, June 2000.
 
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Roberts, B. D., Method of calculating interconnect noise due to cross capacitance in the presence of line resistance, Patent pending.
Collaborative Colleagues:
Prashant Saxena: colleagues
Kumar N. Lalgudi: colleagues
Hans J. Greub: colleagues
Janet M. Wang-Roveda: colleagues