| Performance verification of high-performance ASICs using at-speed structural test |
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Great Lakes Symposium on VLSI
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Proceedings of the 16th ACM Great Lakes symposium on VLSI
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Philadelphia, PA, USA
SESSION: Testing and noise analysis
table of contents
Pages: 247 - 252
Year of Publication: 2006
ISBN:1-59593-347-6
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Authors
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Vikram Iyengar
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IBM Microelectronics, Essex Junction, VT
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Mark Johnson
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IBM Microelectronics, Essex Junction, VT
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Theo Anemikos
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IBM Microelectronics, Essex Junction, VT
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Bob Bassett
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IBM Microelectronics, Essex Junction, VT
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Mike Degregorio
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IBM Microelectronics, Essex Junction, VT
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Rudy Farmer
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IBM Microelectronics, Essex Junction, VT
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Gary Grise
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IBM Microelectronics, Essex Junction, VT
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Phil Stevens
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IBM Microelectronics, Essex Junction, VT
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Mark Taylor
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IBM Microelectronics, Essex Junction, VT
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Frank Woytowich
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IBM Microelectronics, Essex Junction, VT
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Downloads (6 Weeks): 4, Downloads (12 Months): 30, Citation Count: 0
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ABSTRACT
Performance verification is becoming critical to high performance ASICs manufacturing. Performance verification ensures that only those ASICs whose performance is higher than an advertized threshold are shipped to demanding customers. This provides a means to weed out nominal performance ASICs, and also ship ASICs at difference grades. However, performance verification based on functional test requires high-functionality testers that can supply multiple asynchronous clocks. Additionally, functional test requires expensive testers that can operate at the speed of the fastest clock domain on the ASIC. As an alternative, at-speed structural test can provide performance verification capability at very low cost. However, existing structural test methods are inadequate because they are unable to supply sufficiently-varied functional clock sequences to test complex sequential logic. Moreover, they require tight restrictions on the circuit design. In this paper, we present a scalable and flexible structural test method for performance verification of GH-speed ASICs. The proposed method requires no tight restrictions on the circuit design. Moreover, low-cost testers are used, thus sharply reducing test cost.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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