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Performance verification of high-performance ASICs using at-speed structural test
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Source Great Lakes Symposium on VLSI archive
Proceedings of the 16th ACM Great Lakes symposium on VLSI table of contents
Philadelphia, PA, USA
SESSION: Testing and noise analysis table of contents
Pages: 247 - 252  
Year of Publication: 2006
ISBN:1-59593-347-6
Authors
Vikram Iyengar  IBM Microelectronics, Essex Junction, VT
Mark Johnson  IBM Microelectronics, Essex Junction, VT
Theo Anemikos  IBM Microelectronics, Essex Junction, VT
Bob Bassett  IBM Microelectronics, Essex Junction, VT
Mike Degregorio  IBM Microelectronics, Essex Junction, VT
Rudy Farmer  IBM Microelectronics, Essex Junction, VT
Gary Grise  IBM Microelectronics, Essex Junction, VT
Phil Stevens  IBM Microelectronics, Essex Junction, VT
Mark Taylor  IBM Microelectronics, Essex Junction, VT
Frank Woytowich  IBM Microelectronics, Essex Junction, VT
Sponsors
ACM: Association for Computing Machinery
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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ABSTRACT

Performance verification is becoming critical to high performance ASICs manufacturing. Performance verification ensures that only those ASICs whose performance is higher than an advertized threshold are shipped to demanding customers. This provides a means to weed out nominal performance ASICs, and also ship ASICs at difference grades. However, performance verification based on functional test requires high-functionality testers that can supply multiple asynchronous clocks. Additionally, functional test requires expensive testers that can operate at the speed of the fastest clock domain on the ASIC. As an alternative, at-speed structural test can provide performance verification capability at very low cost. However, existing structural test methods are inadequate because they are unable to supply sufficiently-varied functional clock sequences to test complex sequential logic. Moreover, they require tight restrictions on the circuit design. In this paper, we present a scalable and flexible structural test method for performance verification of GH-speed ASICs. The proposed method requires no tight restrictions on the circuit design. Moreover, low-cost testers are used, thus sharply reducing test cost.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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ASICs Test Methodology. IBM Microelectronics. Essex Junction, VT 05452.
 
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V. Ramakrishnan and D.M.H. Walker. Model-based product quantity control. Proc. Electronics Manufacturing Technology Symposium, pp. 389--395, 1995.
 
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Collaborative Colleagues:
Vikram Iyengar: colleagues
Mark Johnson: colleagues
Theo Anemikos: colleagues
Bob Bassett: colleagues
Mike Degregorio: colleagues
Rudy Farmer: colleagues
Gary Grise: colleagues
Phil Stevens: colleagues
Mark Taylor: colleagues
Frank Woytowich: colleagues