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Analysis of the impact of bus implemented EDCs on on-chip SSN
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Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe: Proceedings table of contents
Munich, Germany
SESSION: On-line testing and fault tolerance table of contents
Pages: 59 - 64  
Year of Publication: 2006
ISBN:3-9810801-0-6
Authors
Daniele Rossi  University of Bologna, Viale Risorgimento, Bologna, Italy
Carlo Steiner  University of Bologna, Viale Risorgimento, Bologna, Italy
Cecilia Metra  University of Bologna, Viale Risorgimento, Bologna, Italy
Sponsors
: The EDA Consortium
EDAA : European Design and Automation Association
IEEE-CS\DATC : The IEEE Computer Society
Publisher
European Design and Automation Association  3001 Leuven, Belgium, Belgium
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ABSTRACT

In this paper we analyze the impact of error detecting codes, implemented on an on-chip bus, on the on-chip simultaneous switching noise (SSN). First, we analyze in detail how SSN is impacted by different bus transitions, pointing out its dependency on the number and placement of switching wires. Afterwards, we present an analytical model that we have developed in order to estimate the SSN, and that we prove to be very accurate in SSN prediction. Finally, by employing the developed model, we estimate the SSN due to different EDCs implemented on an on-chip bus. In particular, we highlight how their differences in the number of switching wires, bus parallelism and codewords influence the on-chip SSN.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Semiconductor Industry Assoc., San Jose, Calif. The 2003 National Technology Roadmap for Semiconductors, 2003.
 
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F. Caignet, S. Delmas-Bendhia, and E. Sicard. The Challenge of Signal Integrity in Deep-Submicrometer CMOS Technology. Proc. of IEEE, pages 556 -- 573, April 2001.
 
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Collaborative Colleagues:
Daniele Rossi: colleagues
Carlo Steiner: colleagues
Cecilia Metra: colleagues