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Evaluating coverage of error detection logic for soft errors using formal methods
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Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe: Proceedings table of contents
Munich, Germany
SESSION: Soft error analysis and concurrent testing table of contents
Pages: 176 - 181  
Year of Publication: 2006
ISBN:3-9810801-0-6
Authors
U. Krautz  University of Kaiserslautern
M. Pflanz  IBM Deutschland Entwicklungs GmbH
C. Jacobi  IBM Deutschland Entwicklungs GmbH
H. W. Tast  IBM Deutschland Entwicklungs GmbH
K. Weber  IBM Deutschland Entwicklungs GmbH
H. T. Vierhaus  University of Technology
Sponsors
: The EDA Consortium
EDAA : European Design and Automation Association
IEEE-CS\DATC : The IEEE Computer Society
Publisher
European Design and Automation Association  3001 Leuven, Belgium, Belgium
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Downloads (6 Weeks): 7,   Downloads (12 Months): 61,   Citation Count: 1
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ABSTRACT

In this paper we describe a methodology to measure exactly the quality of fault-tolerant designs by combining fault-injection in high level design (HLD) descriptions with a formal verification approach. We utilize BDD based symbolic simulation to determine the coverage of online error-detection and - correction logic. We describe an easily portable approach, which can be applied to a wide variety of multi-GHz industrial designs.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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C. Constantinescu, "Experimental evaluation of error detection mechanisms", IEEE Transactions on Reliability, Mar 2003, pp. 53--57
 
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S. R. Seward, P. K. Lala, "Fault Injection for Verifying Testability at the VHDL Level", Intl. Test Conference, 2003, p. 131--137
 
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R. Velazco, T. Calin, M. Nicolaidis, S. C. Moss, S. D. LaLumondiere, V. T. Tran, R. Koga, "SEU-hardened storage cell validation using a pulsed laser", Nuclear Science, Vol. 43 No. 6 Dec. 1996, pp. 2843--2848
 
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J.-C. Lo, S. Thanawastien, T. R. N. Rao, M. Nicolaidis, "An SFS Berger Check Prediction ALU and Its Application to Self-Checking Processors Designs", IEEE Trans On CAD, vol. 11, No. 4, April 1992, pp. 525--540
 
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V. Paruthi, C Jacobi_, K. Weber, "Effcient Symbolic Simulation via Dynamic Scheduling, Don't Caring, and Case Splitting", CHARME 2005


Collaborative Colleagues:
U. Krautz: colleagues
M. Pflanz: colleagues
C. Jacobi: colleagues
H. W. Tast: colleagues
K. Weber: colleagues
H. T. Vierhaus: colleagues