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A new method of generating synchronizable test sequences that detect output-shifting faults based on multiple UIO sequences
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Proceedings of the 2006 ACM symposium on Applied computing table of contents
Dijon, France
SESSION: Software engineering: sound solutions for the 21st century table of contents
Pages: 1791 - 1797  
Year of Publication: 2006
ISBN:1-59593-108-2
Authors
Kai Chen  University of Science and Technology of China, Hefei, P.R.China
Fan Jiang  University of Science and Technology of China, Hefei, P.R.China
Chuan-dong Huang  University of Science and Technology of China, Hefei, P.R.China
Sponsor
SIGAPP: ACM Special Interest Group on Applied Computing
Publisher
ACM  New York, NY, USA
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ABSTRACT

The objective of testing is to determine the conformance between a system and its specification. When testing distributed systems, the existence of multiple testers brings out the possibility of synchronization problems among remote testers and the possibility that output-shifting faults go undetected. This paper proposes a new method of generating minimal synchronizable test sequences that detect output-shifting faults based on multiple UIO sequences. The procedure of test generation involves two steps: constructing several auxiliary digraphs from a given specification and finding a rural Chinese post tour (RCPT) in the resultant digraph. When constructing the auxiliary digraphs, different from all the former methods, we use vertices to denote transitions and edges to represent two consecutive transitions. In terms of property and application, the proposed method can construct a relatively simple digraph which makes test generation easily. After applying it to practice, we got hold of better results than the existing methods.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Kai Chen: colleagues
Fan Jiang: colleagues
Chuan-dong Huang: colleagues