| A new method of generating synchronizable test sequences that detect output-shifting faults based on multiple UIO sequences |
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Symposium on Applied Computing
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Proceedings of the 2006 ACM symposium on Applied computing
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Dijon, France
SESSION: Software engineering: sound solutions for the 21 st century
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Pages: 1791 - 1797
Year of Publication: 2006
ISBN:1-59593-108-2
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Authors
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Kai Chen
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University of Science and Technology of China, Hefei, P.R.China
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Fan Jiang
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University of Science and Technology of China, Hefei, P.R.China
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Chuan-dong Huang
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University of Science and Technology of China, Hefei, P.R.China
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ABSTRACT
The objective of testing is to determine the conformance between a system and its specification. When testing distributed systems, the existence of multiple testers brings out the possibility of synchronization problems among remote testers and the possibility that output-shifting faults go undetected. This paper proposes a new method of generating minimal synchronizable test sequences that detect output-shifting faults based on multiple UIO sequences. The procedure of test generation involves two steps: constructing several auxiliary digraphs from a given specification and finding a rural Chinese post tour (RCPT) in the resultant digraph. When constructing the auxiliary digraphs, different from all the former methods, we use vertices to denote transitions and edges to represent two consecutive transitions. In terms of property and application, the proposed method can construct a relatively simple digraph which makes test generation easily. After applying it to practice, we got hold of better results than the existing methods.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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