ACM Home Page
Please provide us with feedback. Feedback
Exploring compromises among timing, power and temperature in three-dimensional integrated circuits
Full text PdfPdf (1.00 MB)
Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 43rd annual conference on Design automation table of contents
San Francisco, CA, USA
SESSION: Session 56: beyond-the-die circuit and system integration table of contents
Pages: 997 - 1002  
Year of Publication: 2006
ISBN:1-59593-381-6
Authors
Hao Hua  North Carolina State University, Raleigh, NC
Chris Mineo  North Carolina State University, Raleigh, NC
Kory Schoenfliess  North Carolina State University, Raleigh, NC
Ambarish Sule  North Carolina State University, Raleigh, NC
Samson Melamed  North Carolina State University, Raleigh, NC
Ravi Jenkal  North Carolina State University, Raleigh, NC
W. Rhett Davis  North Carolina State University, Raleigh, NC
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 14,   Downloads (12 Months): 63,   Citation Count: 0
Additional Information:

abstract   references   index terms   collaborative colleagues  

Tools and Actions: Review this Article  
Save this Article to a Binder    Display Formats: BibTex  EndNote ACM Ref   
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/1146909.1147161
What is a DOI?

ABSTRACT

Three-dimensional integrated circuits (3DICs) have the potential to reduce interconnect lengths and improve digital system performance. However, heat removal is more difficult in 3DICs, and the higher temperatures increase delay and leakage power, potentially negating the performance improvement. Thermal vias can help to remove heat, but they create routing congestion, which also leads to longer interconnects. It is therefore very difficult to tell whether or not a particular system may benefit from 3D integration. In order to help understand this trade-off, physical design experiments were performed on a low-power and a high-performance design in an existing 3DIC technology. Each design was partitioned and routed with varying numbers of tiers and thermal-via densities. A thermal-analysis methodology is developed to predict the final performance. Results show that the lowest energy per operation and delay are achieved with 4 or 5 tiers. These results show a reduction in energy and delay of up to 27% and 20% compared to a traditional 2DIC approach. In addition, it is shown that thermal-vias offer no performance benefit for the low-power system and only marginal benefit for the high-performance system.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
G. Groeseneken, et al"Temperature Dependence of Threshold Voltage in Thin-Film SOI MOSFET's", IEDL, Vol. 11, No. 8, Aug. 1990.
2
 
3
W. Liao, L. He and K. M. Lepak, "Temperature and Supply Voltage Aware Performance and Power Modeling at Microarchitecture Level", TCAD, Vol. 24, No. 7, Jul. 2005.
 
4
A. Rahman, A. Fan and R. Reif, "Thermal analysis of three-dimensional (3-D) integrated circuits (ICs)", IITC, June 2001.
5
 
6
 
7
 
8
 
9
 
10
K. Banerjee, S. J. Souri, P. Kapur and K. C. Saraswat, "3-D ICs: a novel chip design for improving deep-submicrometer interconnect performance and systems-on-chip integration", Proceedings of the IEEE, May 2001.
 
11
A. Bellaouar A., A. Fridi, M. J. Elmasry and K. Itoh, "Supply voltage scaling for temperature insensitive CMOS circuit operation". TCAS II, Mar 1998.
 
12
S. Im and Banerjee, "Full chip thermal analysis of planar (2-D) and vertically integrated (3-D) high performance ICs", IEDM 2000.
 
13
 
14
K. Kanda, K. Nose, H. Kawaguchi and T. Sakurai "Design impact of positive temperature dependence on drain current in sub-1-V CMOS VLSIs". JSSCC, Oct. 2001.
 
15
R. Zhang, K. Roy, Cheng-Kok Koh, D.B. Janes, "Power trends and performance characterization of 3-dimensional integration for future technology generations", ISQED, Mar. 2001.
16
 
17
 
18
G. Karypis and V. Kumar, The METIS Serial Graph Partitioning Tool, available online at http://www-users.cs.umn.edu/~karypis/metis
 
19
 
20
H. Hua, C. Mineo, S. Melamed and W. R. Davis, "The 3DIC Phase 1 Place and Route Flow". NCSU Design-Flow Database, available online at http://www.ece.ncsu.edu/muse/flowdb
 
21
V. Suntharalingam et al, "Megapixel CMOS Image Sensor Fabrication in Three-Dimensional Integrated Circuit Technology", ISSCC, Feb. 2005.
 
22
OpenRISC Reference Platform System-on-a-Chip and OpenRISC 1200 IP Core Specification, available online at http://www.opencores.org/projects.cgi/web/or1k/orpsoc

Collaborative Colleagues:
Hao Hua: colleagues
Chris Mineo: colleagues
Kory Schoenfliess: colleagues
Ambarish Sule: colleagues
Samson Melamed: colleagues
Ravi Jenkal: colleagues
W. Rhett Davis: colleagues