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Efficient parallel algorithms for dead sensor diagnosis and multiple access channels
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Source ACM Symposium on Parallel Algorithms and Architectures archive
Proceedings of the eighteenth annual ACM symposium on Parallelism in algorithms and architectures table of contents
Cambridge, Massachusetts, USA
SESSION: Communication networks table of contents
Pages: 118 - 127  
Year of Publication: 2006
ISBN:1-59593-452-9
Authors
Michael T. Goodrich  University of California, Irvine, CA
Daniel S. Hirschberg  University of California, Irvine, CA
Sponsors
ACM: Association for Computing Machinery
SIGACT: ACM Special Interest Group on Algorithms and Computation Theory
SIGARCH: ACM Special Interest Group on Computer Architecture
Publisher
ACM  New York, NY, USA
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ABSTRACT

We study parallel algorithms for identifying the dead sensors in a mobile ad hoc wireless network and for resolving broadcast conflicts on a multiple access channel (MAC). Our approach involves the development and application of new group-testing algorithms, where we are asked to identify all the defective items in a set of items when we can test arbitrary subsets of items. In the standard group-testing problem, the result of a test is binary--the tested subset either contains defective items or not. In the versions we study in this paper, the result of each test is non-binary. For example, it may indicate whether the number of defective items contained in the tested subset is zero, one, or at least two (i.e., the results are 0, 1, or 2+). We give adaptive algorithms that are provably more efficient than previous group testing algorithms (even for generalized response models). We also show how our algorithms can be implemented in parallel, because they possess a property we call conciseness, which allows them to be used to solve dead sensor diagnosis and conflict resolution on a MAC. Dead sensor diagnosis poses an interesting challenge compared to MAC resolution, because dead sensors are not locally detectable, nor are they themselves active participants. Even so, we present algorithms that can be applied in both contexts that are more efficient than previous methods. We also give lower bounds for generalized group testing.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Michael T. Goodrich: colleagues
Daniel S. Hirschberg: colleagues