skip to main content
10.1145/1148493.1148529acmconferencesArticle/Chapter ViewAbstractPublication PagessoftvisConference Proceedingsconference-collections
Article

Lightweight visualizations for inspecting code smells

Published:04 September 2006Publication History

ABSTRACT

In this paper we present an approach for using lightweight visualizations to inspect bad coding patterns. We demonstrate how our Visual Studio plugin assists developers in finding relevant methods to inspect.

References

  1. Emden, E. V., and Moonen, L. 2002. Java quality assurance by detecting code smells. In WCRE '02: Proceedings of the Ninth Working Conference on Reverse Engineering (WCRE'02), IEEE Computer Society, Washington, DC, USA, 97. Google ScholarGoogle ScholarDigital LibraryDigital Library
  2. Fowler, M., Beck, K., Brant, J., Opdyke, W., and Roberts, D. 2001. Refactoring: Improving the Design of Existing Code. Addison-Wesley.Google ScholarGoogle ScholarDigital LibraryDigital Library
  3. Parnin, C., and Görg, C. 2006. Building usage contexts during program comprehension. In ICPC '06: Proceedings of the 14th International Conference on Program Comprehension, IEEE Computer Society, Washington, DC, USA. Google ScholarGoogle ScholarDigital LibraryDigital Library
  4. Riel, A. J. 1996. Object-Oriented Design Heuristics. Addison-Wesley. Google ScholarGoogle ScholarDigital LibraryDigital Library

Index Terms

  1. Lightweight visualizations for inspecting code smells

    Recommendations

    Comments

    Login options

    Check if you have access through your login credentials or your institution to get full access on this article.

    Sign in
    • Published in

      cover image ACM Conferences
      SoftVis '06: Proceedings of the 2006 ACM symposium on Software visualization
      September 2006
      199 pages
      ISBN:1595934642
      DOI:10.1145/1148493

      Copyright © 2006 ACM

      Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

      Publisher

      Association for Computing Machinery

      New York, NY, United States

      Publication History

      • Published: 4 September 2006

      Permissions

      Request permissions about this article.

      Request Permissions

      Check for updates

      Qualifiers

      • Article

      Acceptance Rates

      Overall Acceptance Rate20of65submissions,31%

    PDF Format

    View or Download as a PDF file.

    PDF

    eReader

    View online with eReader.

    eReader