Design challenges in 45nm and below: DFM, low-power and design for reliability
Abstract
- Design challenges in 45nm and below: DFM, low-power and design for reliability
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- General Chairs:
- Hai Zhou,
- Enrico Macii,
- Program Chairs:
- Zhiyuan Yan,
- Yehia Massoud
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Association for Computing Machinery
New York, NY, United States
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