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- Begam VBaulkani S(2015)Ring Counter Based ATPG for Low Transition Test Pattern GenerationThe Scientific World Journal10.1155/2015/7291652015:1Online publication date: 14-May-2015
- Tharakan AMathew B(2015)Design and Implementation of an On-Chip Test Generation Scheme Based on Reconfigurable Run-Time Programmable and Multiple Twisted-Ring CountersProcedia Computer Science10.1016/j.procs.2015.02.05946:C(1409-1416)Online publication date: 1-Jan-2015
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