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An automated unique tagging system using CMOS process variation

Published: 11 March 2007 Publication History

Abstract

An Automated Unique Tagging System (AUTS) is presented, intended for RFID applications, that generates identification numbers based on random process variations, circumventing the need for non-volatile memories such as EEPROM or Flash. A sense amplifier is used to measure the mismatch in threshold voltage between two identical NMOS devices and generate a 1-bit random output. The AUTS has been fabricated in the TSMC 0.25μm CMOS process and tested.

References

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J. Landt, "The history of RFID," Potentials, IEEE, vol. 24, no. 4, pp. 8--11, Oct.-Nov. 2005.
[2]
R. Barsatan, T.Y. Man, and M. Chan. "A zero-mask one-time programmable memory array for RFID applications," ISCAS 2006. Proceedings. 2006 IEEE International Symposium on Circuits and Systems., May 2006, pp. 975--978.
[3]
T.N. Blalock and R.C. Jaeger. "A high-speed clamped bit-line current-mode sense amplifier," IEEE Journal of Solid-State Circuits, vol. 26, no. 4, pp. 542--548, Apr 1991.
[4]
Y. Su, J. Holleman, and B. Otis. "A 1.6pj/bit 96% stable chip id generating circuit using process variations," Feb. 2007.
[5]
M.J. Pelgrom, A.C. Uinmaijer, and A.P. Welbers. "Matching properties of mos transistors," IEEE Journal of Solid State Circuits, vol. 24, no. 5, pp. 433--1440, Oct. 1989.
[6]
B.L. Dell. "Utilization of cmos process variations for unique bit encoding," Master's thesis, University of Virginia. Aug. 2006.

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  • (2014)39 fJ/bit On-Chip Identification ofWireless Sensors Based on Manufacturing VariationJournal of Low Power Electronics and Applications10.3390/jlpea40302524:3(252-267)Online publication date: 12-Sep-2014

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  1. An automated unique tagging system using CMOS process variation

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    cover image ACM Conferences
    GLSVLSI '07: Proceedings of the 17th ACM Great Lakes symposium on VLSI
    March 2007
    626 pages
    ISBN:9781595936059
    DOI:10.1145/1228784
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Publication History

    Published: 11 March 2007

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    Author Tags

    1. AUTS
    2. RFID
    3. process variation

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    GLSVLSI07: Great Lakes Symposium on VLSI 2007
    March 11 - 13, 2007
    Stresa-Lago Maggiore, Italy

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    Overall Acceptance Rate 312 of 1,156 submissions, 27%

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    • (2014)39 fJ/bit On-Chip Identification ofWireless Sensors Based on Manufacturing VariationJournal of Low Power Electronics and Applications10.3390/jlpea40302524:3(252-267)Online publication date: 12-Sep-2014

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