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- Sayil SSayil S(2022)Single Event Soft ErrorsNoise Contamination in Nanoscale VLSI Circuits10.1007/978-3-031-12751-9_6(81-111)Online publication date: 1-Sep-2022
- Paliaroutis GTsoumanis PEvmorfopoulos NDimitriou GStamoulis G(2020)SET Pulse Characterization and SER Estimation in Combinational Logic with Placement and Multiple Transient Faults ConsiderationsTechnologies10.3390/technologies80100058:1(5)Online publication date: 10-Jan-2020
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