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- Zhang XIshida KFuketa HTakamiya MSakurai T(2012)On-chip measurement system for within-die delay variation of individual standard cells in 65-nm CMOSIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2011.216225720:10(1876-1880)Online publication date: 1-Oct-2012
- Zhang XIshida KTakamiya MSakurai T(2011)An on-chip characterizing system for within-die delay variation measurement of individual standard cells in 65-nm CMOSProceedings of the 16th Asia and South Pacific Design Automation Conference10.5555/1950815.1950846(109-110)Online publication date: 25-Jan-2011
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