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Efficient Boolean characteristic function for fast timed ATPG
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Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design table of contents
San Jose, California
SESSION: Efficient delay test generation table of contents
Pages: 96 - 99  
Year of Publication: 2006
ISBN ~ ISSN:1092-3152 , 1-59593-389-1
Authors
Yu-Min Kuo  National Tsing Hua University, Hsinchu, Taiwan
Yue-Lung Chang  National Tsing Hua University, Hsinchu, Taiwan
Shih-Chieh Chang  National Tsing Hua University, Hsinchu, Taiwan
Sponsors
IEEE-CS : Computer Society
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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ABSTRACT

Circuit timing analysis is important in various aspects of circuit optimization. The problem of finding input vectors achieving functional and temporal requirements is known as timed Automatic Test Pattern Generation (timed ATPG). A timed ATPG algorithm will return an input vector that satisfies functional and temporal requirements simultaneously when evaluated. Several previous works use timed ATPG as a core engine for solving problems related to timing analysis, such as crosstalk and maximum instantaneous current analysis. Despite the usefulness of timed ATPG, traditional timed ATPG is slow and unscalable for large circuits. In this paper, we present a very efficient way for timed ATPG. On average, our results are 8 times faster than the most recent work, and in some cases, up to 32 times faster.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
P. Ashar, and S. Malik, "Functional Timing Analysis Using ATPG," IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, vol. 14, no. 8, pp. 1025--1030, Aug. 1995.
 
2
R. I. Bahar, H. Cho, G. D. Hachtel, E. Macii, and F. Somenzi, "Timing Analysis of Combinational Circuits using ADD's," in Proc. of IEEE European Design Test Conference, pp. 625--629, 1994.
 
3
H.-C. Chen, and D. Du, "Path Sensitization in Critical Path Problem," IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, vol. 12, no. 2, pp. 196--207, Feb. 1993.
 
4
S. Devadas, K. Keutzer, and S. Malik, "Computation of Floating Mode Delay in Combinational Circuits: Theory and Algorithms," IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, vol. 12, no. 12, pp. 1913--1923, Dec. 1993.
 
5
J. L. Güntzel, A. C. M. Pinto, and R. Reis "A Timed Calculus for ATG-Based Timing Analysis of Circuits with Complex Gates," in Proc. IEEE Latin American Test Workshop, pp. 234--239, 2001.
 
6
H. Kriplani, F. Najm, and I. N. Hajj, "Pattern Independent Maximum Current Estimation in Power and Ground Buses of CMOS VLSI Circuits: Algorithms, Signal Correlations, and Their Resolution," IEEE Trans. on Computer-Aided Design, vol. 14, no. 8, pp. 998--1012, Aug. 1995.
 
7
 
8
Y.-M. Jiang, K.-T. Cheng, and A. Krstic, "Estimation of Maximum Power and Instantaneous Current Using a Genetic Algorithm," in Proc. of IEEE Custom Integrated Circuits Conference, pp. 135--138, 1997.
 
9
 
10
 
11
P. C. McGeer, A. Saldanha, P. R. Stephan, R. K. Brayton, and A. L. Sangiovanni-Vicentelli, "Timing Analysis and Delay-Fault Test Generation using Path-Recursive Functions," in Proc. of the ICCAD, pp. 180--183, 1991.
12
 
13
A. Nadel, "Backtrack Search Algorithms for Propositional Satisfiability: Review and Innovations," Master's Thesis, the Hebrew University of Jerusalem, 2002.
 
14
J. P. M. Silva, and K. A. Sakallah, "Efficient and Robust Test Generation-Based Timing Analysis," in Proc. of the International Symposium on Circuits and Systems, pp. 303--306, 1994.
 
15
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17
 
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Collaborative Colleagues:
Yu-Min Kuo: colleagues
Yue-Lung Chang: colleagues
Shih-Chieh Chang: colleagues