Article

A novel framework for faster-than-at-speed delay test considering IR-drop effects

Authors:

Nisar Ahmed,

Mohammad Tehranipoor,

Vinay JayaramAuthors Info & Claims

ICCAD '06: Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design

Pages 198 - 203

https://doi.org/10.1145/1233501.1233541

Published: 05 November 2006 Publication History

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Abstract

Faster-than-at-speed test have been proposed to detect small delay defects. While these techniques increase the test frequency to reduce the positive slack of the path, they exacerbate the already well known issue of IR-drop during test. This may result in false identification of good chips to be faulty due to IR-drop rather than small delay defects. We present a case study of IR-drop effects due to faster-than-at-speed test. We propose a novel framework for pattern generation/application using any commercial no-timing ATPG tool, to screen small delay defects and a technique to determine the optimal test frequency considering both performance degradation due to IR-drop effects and positive slack.

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Cited By

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Wunderlich H(2022)Machine Learning Support for Logic Diagnosis and Defect ClassificationMachine Learning Support for Fault Diagnosis of System-on-Chip10.1007/978-3-031-19639-3_4(99-133)Online publication date: 22-Oct-2022
https://doi.org/10.1007/978-3-031-19639-3_4
Ahmad SIqbal K(2020)X-Sand Filter: An X-Tolerant Response Compaction Technique for Faster-Than-At-Speed TestingMehran University Research Journal of Engineering and Technology10.22581/muet1982.2002.1139:2(353-364)Online publication date: 1-Apr-2020
https://doi.org/10.22581/muet1982.2002.11
Ahmad SIqbal K(2020)X-Sand Filter: An X-Tolerant Response Compaction Technique for Faster-Than-At-Speed TestingMehran University Research Journal of Engineering and Technology10.22581/10.22581/muet1982.2002.1139:2(353-364)Online publication date: 1-Apr-2020
https://doi.org/10.22581/10.22581/muet1982.2002.11
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A novel framework for faster-than-at-speed delay test considering IR-drop effects
1. Hardware

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Published In

ICCAD '06: Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design

November 2006

147 pages

ISBN:1595933891

DOI:10.1145/1233501

General Chair:
Soha Hassoun
Tufts Univ., Medford, MA

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

New York, NY, United States

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Published: 05 November 2006

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ICCAD06: The International Conference on Computer-Aided Design 2006

November 5 - 9, 2006

California, San Jose

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Overall Acceptance Rate 457 of 1,762 submissions, 26%

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Wunderlich H(2022)Machine Learning Support for Logic Diagnosis and Defect ClassificationMachine Learning Support for Fault Diagnosis of System-on-Chip10.1007/978-3-031-19639-3_4(99-133)Online publication date: 22-Oct-2022
https://doi.org/10.1007/978-3-031-19639-3_4
Ahmad SIqbal K(2020)X-Sand Filter: An X-Tolerant Response Compaction Technique for Faster-Than-At-Speed TestingMehran University Research Journal of Engineering and Technology10.22581/muet1982.2002.1139:2(353-364)Online publication date: 1-Apr-2020
https://doi.org/10.22581/muet1982.2002.11
Ahmad SIqbal K(2020)X-Sand Filter: An X-Tolerant Response Compaction Technique for Faster-Than-At-Speed TestingMehran University Research Journal of Engineering and Technology10.22581/10.22581/muet1982.2002.1139:2(353-364)Online publication date: 1-Apr-2020
https://doi.org/10.22581/10.22581/muet1982.2002.11
Cui XKoopahi EWu KKarri R(2018)Hardware Trojan Detection Using the Order of Path DelayACM Journal on Emerging Technologies in Computing Systems10.1145/322905014:3(1-23)Online publication date: 23-Oct-2018
https://dl.acm.org/doi/10.1145/3229050
Suresh CSinanoglu OOzev S(2016)Adapting to Varying Distribution of Unknown Response BitsACM Transactions on Design Automation of Electronic Systems10.1145/283548921:2(1-22)Online publication date: 28-Jan-2016
https://dl.acm.org/doi/10.1145/2835489
Chen FChen SLin YHwang T(2011)A physical-location-aware fault redistribution for maximum IR-drop reductionProceedings of the 16th Asia and South Pacific Design Automation Conference10.5555/1950815.1950950(701-706)Online publication date: 25-Jan-2011
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Tehranipoor MPeng KChakrabarty KTehranipoor MPeng KChakrabarty K(2011)Delay Test and Small-Delay DefectsTest and Diagnosis for Small-Delay Defects10.1007/978-1-4419-8297-1_2(21-36)Online publication date: 8-Aug-2011
https://doi.org/10.1007/978-1-4419-8297-1_2
Pei SLi HLi XDe Micheli GAl-Hashimi BMueller WMacii E(2010)An on-chip clock generation scheme for faster-than-at-speed delay testingProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871251(1353-1356)Online publication date: 8-Mar-2010
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Hsieh WLin IHwang TBenini LDe Micheli GAl-Hashimi BMueller W(2009)A physical-location-aware X-filling method for IR-drop reduction in at-speed scan testProceedings of the Conference on Design, Automation and Test in Europe10.5555/1874620.1874917(1234-1237)Online publication date: 20-Apr-2009
https://dl.acm.org/doi/10.5555/1874620.1874917
Miyase KNoda KIto HHatayama KAikyo TYamato YFurukawa HWen XKajihara SNassif SRoychowdhury J(2008)Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-IdentificationProceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design10.5555/1509456.1509480(52-58)Online publication date: 10-Nov-2008
https://dl.acm.org/doi/10.5555/1509456.1509480
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A novel faster-than-at-speed transition-delay test method considering IR-drop effects

Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing

A physical-location-aware X-filling method for IR-drop reduction in at-speed scan test

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