Article

Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers

Authors:

Kevin B. RedmondAuthors Info & Claims

ICCAD '06: Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design

Pages 210 - 216

https://doi.org/10.1145/1233501.1233543

Published: 05 November 2006 Publication History

Abstract

As wireless LAN devices become more prevalent in the consumer electronics market, there is an ever increasing pressure to reduce their overall cost. The test cost of such devices is an appreciable percentage of the overall cost, which typically results from the high number of specifications, the high number of distinct test set-ups and equipment pieces that need to be used, and the high cost of each test set-up. In this paper, we investigate the versatility of EVM measurements to test the variable-envelope WLAN (Wireless Local Area Networks) receiver and transmitter characteristics. The goal is to optimize EVM test parameters (input data and test limits) and to reduce the number of specification measurements that require high test times and/or expensive test equipment. Our analysis shows that enhanced EVM measurements(optimized data sequence and limits, use of RMS, scale, and phase error vector values) in conjunction with a set of simple path measurements (input-output impedances) can provide the desired fault coverage while eliminating lengthy spectrum mask and noise figure tests

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Cited By

Acar EOzev S(2009)Low-cost characterization and calibration of RF integrated circuits through I-Q data analysisIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2009.202071828:7(993-1005)Online publication date: 1-Jul-2009
https://dl.acm.org/doi/10.1109/TCAD.2009.2020718

Index Terms

Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers

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cover image ACM Conferences

ICCAD '06: Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design

November 2006

147 pages

ISBN:1595933891

DOI:10.1145/1233501

General Chair:
Soha Hassoun
Tufts Univ., Medford, MA

Copyright © 2006 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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SIGDA: ACM Special Interest Group on Design Automation
IEEE-CAS: Circuits & Systems
IEEE-CS: Computer Society

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Association for Computing Machinery

New York, NY, United States

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Published: 05 November 2006

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ICCAD06: The International Conference on Computer-Aided Design 2006

November 5 - 9, 2006

California, San Jose

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Cited By

Acar EOzev S(2009)Low-cost characterization and calibration of RF integrated circuits through I-Q data analysisIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2009.202071828:7(993-1005)Online publication date: 1-Jul-2009
https://dl.acm.org/doi/10.1109/TCAD.2009.2020718

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