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Algorithms for MIS vector generation and pruning

Published:05 November 2006Publication History

ABSTRACT

Ignoring the effect of simultaneous switching for logic gates causes silicon failures for high performance microprocessor designs. The main reason to omit this effect is the run time penalty and potential over-conservatism. Run times are directly proportional to the vector sizes. Efficient algorithms are presented that prune the multiple input switching (MIS) vector set to a worst-case covering using a boolean logic abstraction of the gate. This non-physical representation reduces the vector size to approximately n vectors for an n-input gate. This is effectively the same vector set size as the optimal single input switching vector set. There are no errors for 88% the simulations using a Monty-Carlo coverage on a 90nm static library, and the magnitude of the errors are less than 5% on average.

References

  1. V. Chandramouli and K. A. Sakallah. Modeling the Effects of Temporal Proximity of Input Transitions on Gate Propagation Delay and Transition Time. In 33rd Design Automation Conference Proceedings 1996, pages 617--622, June 1996. Google ScholarGoogle ScholarDigital LibraryDigital Library
  2. L.-C. Chen, S. K. Gupta, and M. A. Breuer. A New Gate Delay Model for Simultaneous Switching and its Applications. In Design Automation Conference Proceedings, pages 289--294, June 2001. Google ScholarGoogle ScholarDigital LibraryDigital Library
  3. Y.-H. Jun, K. Jun, and S.-B. Park. An Accurate and Efficient Delay Time Modeling for MOS Logic Circuits Using Polynomial Approximation. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 8(9):1027--1032, Sept. 1989.Google ScholarGoogle ScholarDigital LibraryDigital Library
  4. L. McMurchie and C. Sechen. WTA: Waveform-Based Timing Analysis for Deep Submicron Circuits. In International Conference on Computer-Aided Design (ICCAD'02), pages 625--631, November 2002. Google ScholarGoogle ScholarDigital LibraryDigital Library
  5. C. E. Molnar, I. W. Jones, W. S. Coates, J. K. Lexau, S. M. Fairbanks, and I. E. Sutherland. Two FIFO Ring Performance Experiments. Proceedings of the IEEE, 87(2):297--307, February 1999.Google ScholarGoogle Scholar
  6. K. T. Tang and E. G. Friedman. Delay Uncertainty Due To On-Chip Simultaneous Switching Noise in High Performance CMOS Integrated circuits. In IEEE Workshop on Signal Processing Systems, pages 633--642. IEEE, Oct. 2000.Google ScholarGoogle Scholar

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  1. Algorithms for MIS vector generation and pruning

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          • Published in

            cover image ACM Conferences
            ICCAD '06: Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
            November 2006
            147 pages
            ISBN:1595933891
            DOI:10.1145/1233501

            Copyright © 2006 ACM

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            Association for Computing Machinery

            New York, NY, United States

            Publication History

            • Published: 5 November 2006

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