Near-term industrial perspective of analog CAD
Abstract
Index Terms
- Near-term industrial perspective of analog CAD
Recommendations
Automation in mixed-signal design: challenges and solutions in the wake of the nano era
ICCAD '06: Proceedings of the 2006 IEEE/ACM international conference on Computer-aided designThe use of CMOS nanometer technologies at 65 nm and below will pose serious challenges on the design of mixed-signal integrated systems in the very near future. Rising design complexities, tightening time-to-market constraints, leakage power, increasing ...
Simultaneous multi-topology multi-objective sizing across thousands of analog circuit topologies
DAC '07: Proceedings of the 44th annual Design Automation ConferenceThis paper presents MOJITO, a system which optimizes across thousands of analog circuit topologies simultaneously, and returns a set of sized topologies that collectively provide a performance tradeoff. MOJITO defines a space of possible topologies as a ...
Hierarchical approach to exact symbolic analysis of large analog circuits
DAC '04: Proceedings of the 41st annual Design Automation ConferenceThis paper provides a novel approach to exact symbolic analysis of very large analog circuits. The new method is based on determinant decision diagrams (DDDs) to represent symbolic product terms. But instead of constructing DDD graphs directly from a ...
Comments
Information & Contributors
Information
Published In

Sponsors
- SIGDA: ACM Special Interest Group on Design Automation
- IEEE-CAS: Circuits & Systems
- IEEE-CS: Computer Society
Publisher
Association for Computing Machinery
New York, NY, United States
Publication History
Check for updates
Author Tags
Qualifiers
- Article
Conference
- SIGDA
- IEEE-CAS
- IEEE-CS
Acceptance Rates
Contributors
Other Metrics
Bibliometrics & Citations
Bibliometrics
Article Metrics
- 0Total Citations
- 135Total Downloads
- Downloads (Last 12 months)1
- Downloads (Last 6 weeks)0
Other Metrics
Citations
View Options
Login options
Check if you have access through your login credentials or your institution to get full access on this article.
Sign in