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System-level process-driven variability analysis for single and multiple voltage-frequency island systems

Published: 05 November 2006 Publication History

Abstract

The problem of determining bounds for application completion times running on generic systems comprised of single or multiple voltage-frequency islands (VFIs) with arbitrary topologies is addressed in the context of manufacturing-driven variability. The approach provides an exact solution for the system-level timing yield in single clock, single voltage (SSV) and VFI systems with an underlying tree-based topology, and a tight upper bound for generic, non-tree based topologies. The results show that: (a) timing yield for overall source-to- sink completion time for generic systems can be modeled in an exact manner for both SSV and VFI systems; and (b) multiple VFI, latency-constrained systems can achieve 11--90% higher timing yield than their SSV counterparts. The results are proven formally and supported by experimental results on two embedded applications, namely software defined radio and MPEG2 encoder.

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  1. System-level process-driven variability analysis for single and multiple voltage-frequency island systems

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      cover image ACM Conferences
      ICCAD '06: Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
      November 2006
      147 pages
      ISBN:1595933891
      DOI:10.1145/1233501
      Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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      Published: 05 November 2006

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      1. variability
      2. voltage-frequency islands

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      Cited By

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      • (2014)Cost-effective lifetime and yield optimization for NoC-based MPSoCsACM Transactions on Design Automation of Electronic Systems10.1145/253557519:2(1-33)Online publication date: 28-Mar-2014
      • (2012)Technology-driven limits on runtime power management algorithms for multiprocessor systems-on-chipACM Journal on Emerging Technologies in Computing Systems10.1145/2367736.23677398:4(1-17)Online publication date: 30-Nov-2012
      • (2011)Variation-Aware Task and Communication Mapping for MPSoC ArchitectureIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2010.207783030:2(295-307)Online publication date: 1-Feb-2011
      • (2010)Slack allocation for yield improvement in NoC-based MPSoCs2010 11th International Symposium on Quality Electronic Design (ISQED)10.1109/ISQED.2010.5450496(738-746)Online publication date: Mar-2010
      • (2009)System-level process variability analysis and mitigation for 3D MPSoCsProceedings of the Conference on Design, Automation and Test in Europe10.5555/1874620.1874772(604-609)Online publication date: 20-Apr-2009
      • (2009)Variation-tolerant dynamic power management at the system-levelIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2009.201980317:9(1220-1232)Online publication date: 1-Sep-2009
      • (2009)System-level process variability analysis and mitigation for 3D MPSoCs2009 Design, Automation & Test in Europe Conference & Exhibition10.1109/DATE.2009.5090739(604-609)Online publication date: Apr-2009
      • (2008)Process variation aware system-level task allocation using stochastic ordering of delay distributionsProceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design10.5555/1509456.1509583(570-574)Online publication date: 10-Nov-2008
      • (2008)Variability-driven module selection with joint design time optimization and post-silicon tuningProceedings of the 2008 Asia and South Pacific Design Automation Conference10.5555/1356802.1356806(2-9)Online publication date: 21-Jan-2008
      • (2008)A variation aware high level synthesis frameworkProceedings of the conference on Design, automation and test in Europe10.1145/1403375.1403630(1063-1068)Online publication date: 10-Mar-2008
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