Article

Robust estimation of parametric yield under limited descriptions of uncertainty

Authors:

Michael OrshanskyAuthors Info & Claims

ICCAD '06: Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design

Pages 884 - 890

https://doi.org/10.1145/1233501.1233686

Published: 05 November 2006 Publication History

Abstract

Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributional properties of the process data. Existing methods are inadequate when dealing with real-life distributions of process and environmental parameters, and limited availability of parameter data during early design. This paper proposes a robust technique for full-chip parametric yield estimation; the proposed work is based on the rigorous notions of non-parametric robust statistics which permits estimation based on the knowledge of the range and the limited number of moments (e.g. mean and variance) of the parameter distributions. Fully or partially specified process and environmental parameters can be described by robust representations, and used to estimate probabilistic bounds for leakage dissipation. The proposed approach is applied to estimating the chip-level parametric yield. The experimental results show that the robust estimation algorithm improves the total leakage estimate by 5-13% at the 99^th percentile across distinct frequency bins, compared to using only the intervals of partially-specified parameters.

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Cited By

Baudoui VKlotz PHiriart-Urruty JJan SMorel F(2012)LOcal Uncertainty Processing (LOUP) method for multidisciplinary robust design optimizationStructural and Multidisciplinary Optimization10.1007/s00158-012-0798-046:5(711-726)Online publication date: 1-Nov-2012
https://dl.acm.org/doi/10.1007/s00158-012-0798-0
Sun JHuang YLi JWang JKyung CChoi KHa S(2008)Chebyshev affine arithmetic based parametric yield prediction under limited descriptions of uncertaintyProceedings of the 2008 Asia and South Pacific Design Automation Conference10.5555/1356802.1356931(531-536)Online publication date: 21-Jan-2008
https://dl.acm.org/doi/10.5555/1356802.1356931
Chen RZhou HGielen G(2007)Timing budgeting under arbitrary process variationsProceedings of the 2007 IEEE/ACM international conference on Computer-aided design10.5555/1326073.1326144(344-349)Online publication date: 5-Nov-2007
https://dl.acm.org/doi/10.5555/1326073.1326144
Show More Cited By

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Robust estimation of parametric yield under limited descriptions of uncertainty
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cover image ACM Conferences

ICCAD '06: Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design

November 2006

147 pages

ISBN:1595933891

DOI:10.1145/1233501

General Chair:
Soha Hassoun
Tufts Univ., Medford, MA

Copyright © 2006 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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SIGDA: ACM Special Interest Group on Design Automation
IEEE-CAS: Circuits & Systems
IEEE-CS: Computer Society

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 05 November 2006

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ICCAD06: The International Conference on Computer-Aided Design 2006

November 5 - 9, 2006

California, San Jose

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Cited By

Baudoui VKlotz PHiriart-Urruty JJan SMorel F(2012)LOcal Uncertainty Processing (LOUP) method for multidisciplinary robust design optimizationStructural and Multidisciplinary Optimization10.1007/s00158-012-0798-046:5(711-726)Online publication date: 1-Nov-2012
https://dl.acm.org/doi/10.1007/s00158-012-0798-0
Sun JHuang YLi JWang JKyung CChoi KHa S(2008)Chebyshev affine arithmetic based parametric yield prediction under limited descriptions of uncertaintyProceedings of the 2008 Asia and South Pacific Design Automation Conference10.5555/1356802.1356931(531-536)Online publication date: 21-Jan-2008
https://dl.acm.org/doi/10.5555/1356802.1356931
Chen RZhou HGielen G(2007)Timing budgeting under arbitrary process variationsProceedings of the 2007 IEEE/ACM international conference on Computer-aided design10.5555/1326073.1326144(344-349)Online publication date: 5-Nov-2007
https://dl.acm.org/doi/10.5555/1326073.1326144
Yu GDong WFeng ZLi PLevitan S(2007)A framework for accounting for process model uncertainty in statistical static timing analysisProceedings of the 44th annual Design Automation Conference10.1145/1278480.1278686(829-834)Online publication date: 4-Jun-2007
https://dl.acm.org/doi/10.1145/1278480.1278686

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