Article

Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube FETs

Authors:

Hamidreza Hashempour,

Fabrizio LombardiAuthors Info & Claims

DATE '07: Proceedings of the conference on Design, automation and test in Europe

Pages 841 - 846

Published: 16 April 2007 Publication History

Get Access

Abstract

Carbon Nanotube Field Effect Transistors (CNTFET) are promising nano-scaled devices for implementing high performance, very dense and low power circuits. The core of a CNTFET is a carbon nanotube. Its conductance property is determined by the so-called chirality of the tube; chirality is difficult to control during manufacturing. This results in conducting (metallic) nanotubes and defective CNTFETs similar to stuck-on (SON or source-drain short) faults, as encountered in classical MOS devices. This paper studies this phenomenon by using layout information and presents modeling and detection methodologies for nano-scaled defects arising from the presence of metallic carbon nanotubes. For CNTFET-based circuits (e.g. intramolecular), these defects are analyzed using a traditional stuck-at fault model. This analysis is applicable to primitive and complex gates. Simulation results are presented for detecting modeled metallic nanotube faults in CNTFETs using a single stuck-at fault test set. A high coverage is achieved (~98%).

References

[1]

S. Ijima "Helical Microtubules of Graphitic Carbon," Nature, Vol. 354, pp. 56--58, Nov. 1991.

Crossref

Google Scholar

[2]

V. Derycke, R. Martle, J. Appenzeller, and P. Avouris, "Carbon Nanotubes Inter- and Interamolecular Logic Gates," Nano Letters, Vol. 1, pp. 453--456, 2001.

Crossref

Google Scholar

[3]

P. Avouris, J. Appenzeller, R. Martel, and S. J. Wind, "Carbon Nanotube Electronics," Proc. of IEEE, Vol. 91, No. 11, pp. 1772--1784, Nov. 2003.

Crossref

Google Scholar

[4]

P. L. McEuen, M. S. Fuhrer, and H. Park "Single-Walled Carbon Nanotube Electronics," IEEE Tran. on Nanotechnology, Vol. 1, No. 1, pp. 78--85, March 2002.

Digital Library

Google Scholar

[5]

S. J. Tans, A. R. M. Verschueren, and C. Dekker, "Room-Temperature Transistor based on a Single Carbon Nanotube," Nature, Vol. 393, pp. 49--52, May 1998.

Crossref

Google Scholar

[6]

A. Bachtold, P. Hadley, T. Nakanishi, and C. Dekker, "Logic Circuits with Carbon Nanotube Transistors," Science, Vol. 294, No. 5545, pp. 1317--1320, Oct. 2001.

Crossref

Google Scholar

[7]

S. J. Wind, J. Appenzeller, R. Martel, V. Derycke, and Ph. Avouris, "Vertical Scaling of Carbon Nanotube Field-Effect Transistors using Top Gate Electrodes," Applied Phys. Lett., Vol. 80, No. 20, pp. 3817--3819, May 2002.

Crossref

Google Scholar

[8]

C. L. Cheung, A. Kurtz, H. Park, C. M. Lieber, "Diameter-Controlled Synthesis of Carbon Nanotubes," J. Phys. Chem. B, Vol. 106, pp. 2429--2433, 2002.

Crossref

Google Scholar

[9]

P. G. Collins, M. S. Arnold, and P. Avouris "Engineering Carbon Nanotubes Using Electrical Breakdown," Science, Vol. 292, pp. 706--709, 2001.

Crossref

Google Scholar

[10]

T. Uehara and W. M. vanCleemput, "Optimal Layout of CMOS Functional Arrays," IEEE Tran. on Computer., Vol. C-30, No. 5, pp. 305--312, May 1981.

Google Scholar

[11]

R. L. Maziasz and J. P. Hayes, "Layout Optimization of CMOS Functional Cells," Proc. of IEEE Design Automation Conf., pp. 544--551, 1987.

Digital Library

Google Scholar

[12]

B. S. Carlson, C. Y. R. Chen, and U. Singh, "Optimal Cell Generation for Dual Independent Layout Styles," IEEE Tran. on Computer Aided Design, Vol. 10, No. 6, pp. 770--782, June 1991.

Digital Library

Google Scholar

[13]

S. Hwang, R. Rajsuman, and S. Davidson, "IDDQ Detection of CMOS Bridging Faults by Stuck-At Fault Tests," Proc. of IEEE Intl. Conf. on VLSI Design, pp. 183--186, 1994.

Google Scholar

[14]

I. Hamzaoglu and J. H. Patel, "Test Set Compaction Algorithms for Combinational Circuits," Proc. of IEEE Intl. Conf. on Computer Aided Design, pp. 283--289, 1998.

Digital Library

Google Scholar

Cited By

View all

Li TXie FLiang XXu QChakrabarty KJing NJiang L(2016)A Novel Test Method for Metallic CNTs in CNFET-Based SRAMsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2015.251290935:7(1192-1205)Online publication date: 1-Jul-2016
https://dl.acm.org/doi/10.1109/TCAD.2015.2512909
Xie FLiang XXu QChakrabarty KJing NJiang L(2015)Jump test for metallic CNTs in CNFET-based SRAMProceedings of the 52nd Annual Design Automation Conference10.1145/2744769.2744864(1-6)Online publication date: 7-Jun-2015
https://dl.acm.org/doi/10.1145/2744769.2744864

Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube FETs
1. Hardware

Recommendations

Carbon nanotube circuits in the presence of carbon nanotube density variations
DAC '09: Proceedings of the 46th Annual Design Automation Conference

Carbon Nanotubes (CNTs) are grown using chemical synthesis. As a result, it is extremely difficult to ensure exact positioning and uniform density of CNTs. Density variations in CNT growth can compromise reliability of Carbon Nanotube Field Effect ...
Carbon nanotube correlation: promising opportunity for CNFET circuit yield enhancement
DAC '10: Proceedings of the 47th Design Automation Conference

Carbon Nanotubes (CNTs) are grown using chemical synthesis, and the exact positioning and chirality of CNTs are very difficult to control. As a result, "small-width" Carbon Nanotube Field-Effect Transistors (CNFETs) can have a high probability of ...
Novel attributes in scaling issues of carbon nanotube field-effect transistors

For the first time, we present a scaling study of carbon nanotube field-effect transistors (CNTFETs) using a two-dimensional model. We investigate the scaling issues in device performance focusing on transconductance characteristics, output ...

Comments

Information & Contributors

Information

Published In

DATE '07: Proceedings of the conference on Design, automation and test in Europe

April 2007

1741 pages

ISBN:9783981080124

General Chair:
Rudy Lauwereins
IMEC and KULeuven, Belgium
,
Program Chair:
Jan Madsen
DTU, Denmark

Publisher

EDA Consortium

San Jose, CA, United States

Publication History

Published: 16 April 2007

Check for updates

Author Tags

Qualifiers

Article

Conference

DATE07

Sponsor:

EDAA
SIGDA
The Russian Academy of Sciences

DATE07: Design, Automation and Test in Europe

April 16 - 20, 2007

Nice, France

Acceptance Rates

Overall Acceptance Rate 518 of 1,794 submissions, 29%

Upcoming Conference

DATE '25

Sponsor:
sigda

Design, Automation and Test in Europe

March 31 - April 2, 2025

Lyon , France

Contributors

Other Metrics

View Article Metrics

Bibliometrics & Citations

Bibliometrics

Article Metrics

2
Total Citations
View Citations
286
Total Downloads

Downloads (Last 12 months)1
Downloads (Last 6 weeks)0

Reflects downloads up to 01 Mar 2025

Other Metrics

View Author Metrics

Citations

Cited By

View all

Li TXie FLiang XXu QChakrabarty KJing NJiang L(2016)A Novel Test Method for Metallic CNTs in CNFET-Based SRAMsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2015.251290935:7(1192-1205)Online publication date: 1-Jul-2016
https://dl.acm.org/doi/10.1109/TCAD.2015.2512909
Xie FLiang XXu QChakrabarty KJing NJiang L(2015)Jump test for metallic CNTs in CNFET-based SRAMProceedings of the 52nd Annual Design Automation Conference10.1145/2744769.2744864(1-6)Online publication date: 7-Jun-2015
https://dl.acm.org/doi/10.1145/2744769.2744864

View Options

Login options

Check if you have access through your login credentials or your institution to get full access on this article.

Full Access

Get this Publication

View options

PDF

View or Download as a PDF file.

PDF

eReader

View online with eReader.

eReader

Abstract

References

Cited By

Recommendations

Carbon nanotube circuits in the presence of carbon nanotube density variations

Carbon nanotube correlation: promising opportunity for CNFET circuit yield enhancement

Novel attributes in scaling issues of carbon nanotube field-effect transistors

Comments

Information

Published In

Sponsors

Publisher

Publication History

Check for updates

Author Tags

Qualifiers

Conference

Acceptance Rates

Upcoming Conference

Contributors

Other Metrics

Bibliometrics

Article Metrics

Other Metrics

Citations

Cited By

Login options

Full Access

View options

PDF

eReader

Share

Share this Publication link

Share on social media

Affiliations