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Design and DfT of a high-speed area-efficient embedded asynchronous FIFO
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Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe table of contents
Nice, France
SESSION: Nano and FIFO table of contents
Pages: 853 - 858  
Year of Publication: 2007
ISBN:978-3-9810801-2-4
Authors
Paul Wielage  NXP Semiconductors, Research - Digital Design & Test, The Netherlands and currently NXP Semiconductors' IC Laboratory in Eindhoven, The Netherlands
Erik Jan Marinissen  NXP Semiconductors, Research - Digital Design & Test, The Netherlands
Michel Altheimer  NXP Semiconductors, Digital Library Technology, Sophia Antipolis, Valbonne, France and currently with NXP Semiconductors in Crolles, France
Clemens Wouters  NXP Semiconductors, Digital Library Technology, The Netherlands
Sponsors
: IEEE Council on Electronic Design Automation (CEDA)
: The EDA Consortium
EDAA : European Design and Automation Association
SIGDA : ACM Design Automation
RAS : RAS
: The IEEE Computer Society TTTC
: ECSI
Publisher
EDA Consortium  San Jose, CA, USA
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ABSTRACT

Embedded First-In First-Out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded ripple-through FIFO module with asynchronous read and write clocks. The implementation is based on a micropipeline architecture and is at least a factor two smaller than SRAM-based and standard-cell-based counterparts. This paper gives an overview of the most important design features of the new FIFO module and describes its test and design-for-test approach.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Ad M. G. Peeters. Single-Rail Handshake Circuits. PhD thesis, Eindhoven University of Technology, June 1996.
 
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Jens Sparsø and Steve Furber, editors. Principles of Asynchronous Circuit Design: A Systems Perspective. Kluwer Academic Publishers, Dordrecht, The Netherlands, September 2001.
 
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S. Schuster et al. Asynchronous Interlocked Pipelined CMOS Circuits Operating at 3.3--4.5 GHz. In Proceedings International Solid State Circuits Conference (ISSCC), pages 292--293, San Francisco, CA, USA, February 2000.
 
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Feng Shi, Yiorgos Makris, Steven M. Nowick, and Montek Singh. Test Generation for Ultra-High-Speed Asynchronous Pipelines. In Proceedings IEEE International Test Conference (ITC), pages 1009--1018, Austin, TX, USA, November 2005.
 
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Frans Beenker, Karel van Eerdewijk, Robert Gerritsen, Frank Peacock, and Max van der Star. Macro Testing: Unifying IC and Board Test. IEEE Design & Test of Computers, 3(4):26--32, December 1986.
 
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Francisco DaSilva, editor. IEEE Std 1500#8482;-2005, IEEE Standard Testability Method for Embedded Core-based Integrated Circuits. IEEE Standards Association, New York, NY, USA, August 2005.
 
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Collaborative Colleagues:
Paul Wielage: colleagues
Erik Jan Marinissen: colleagues
Michel Altheimer: colleagues
Clemens Wouters: colleagues