| Design and DfT of a high-speed area-efficient embedded asynchronous FIFO |
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Design, Automation, and Test in Europe
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Proceedings of the conference on Design, automation and test in Europe
table of contents
Nice, France
SESSION: Nano and FIFO
table of contents
Pages: 853 - 858
Year of Publication: 2007
ISBN:978-3-9810801-2-4
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Authors
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Paul Wielage
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NXP Semiconductors, Research - Digital Design & Test, The Netherlands and currently NXP Semiconductors' IC Laboratory in Eindhoven, The Netherlands
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Erik Jan Marinissen
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NXP Semiconductors, Research - Digital Design & Test, The Netherlands
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Michel Altheimer
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NXP Semiconductors, Digital Library Technology, Sophia Antipolis, Valbonne, France and currently with NXP Semiconductors in Crolles, France
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Clemens Wouters
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NXP Semiconductors, Digital Library Technology, The Netherlands
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EDA Consortium
San Jose, CA, USA
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Downloads (6 Weeks): 2, Downloads (12 Months): 56, Citation Count: 1
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ABSTRACT
Embedded First-In First-Out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded ripple-through FIFO module with asynchronous read and write clocks. The implementation is based on a micropipeline architecture and is at least a factor two smaller than SRAM-based and standard-cell-based counterparts. This paper gives an overview of the most important design features of the new FIFO module and describes its test and design-for-test approach.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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CITED BY
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Tobias Dubois , Erik Jan Marinissen , Mohamed Azimane , Paul Wielage , Erik Larsson , Clemens Wouters, Test quality analysis and improvement for an embedded asynchronous FIFO, Proceedings of the conference on Design, automation and test in Europe, April 16-20, 2007, Nice, France
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