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View all- Bronckers SScheir KVan der Plas GVandersteen GRolain Y(2009)A methodology to predict the impact of substrate noise in analog/RF systemsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2009.203036028:11(1613-1626)Online publication date: 1-Nov-2009