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Test purpose generation in an industrial application
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Source Workshop on Advances in Model-Based Testing archive
Proceedings of the 3rd international workshop on Advances in model-based testing table of contents
London, United Kingdom
Pages: 115 - 125  
Year of Publication: 2007
ISBN:978-1-59593-850-3
Authors
Bernhard K. Aichernig  Technische Universität Graz, Graz, Austria
Martin Weiglhofer  Technische Universität Graz, Graz, Austria
Bernhard Peischl  Technische Universität, Graz Graz, Austria
Franz Wotawa  Technische Universität, Graz, Graz, Austria
Publisher
ACM  New York, NY, USA
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ABSTRACT

Nowadays test engineers use various strategies for the design of test cases. Among others, test cases are designed on basis of structural coverage criteria or test cases are related to specific fault models. In this paper we evaluate these two techniques for test purpose design. We present a heuristic algorithm for the extraction of test cases from TGV's output, i.e., the test process. We discuss the problem of overlapping test purposes and illustrate improvements in terms of test execution time and in terms of number of test cases when minimizing this overlap. Furthermore, we present different strategies for the generation of fault-based test purposes. For our evaluation we apply the presented techniques to a Session Initiation Protocol (SIP) Registrar specification. All extracted test cases are executed against a commercial and an open source implementation of such a SIP Registrar.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Bernhard K. Aichernig: colleagues
Martin Weiglhofer: colleagues
Bernhard Peischl: colleagues
Franz Wotawa: colleagues