research-article

Automating post-silicon debugging and repair

Authors:

Igor L. Markov,

Valeria BertaccoAuthors Info & Claims

ICCAD '07: Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design

Pages 91 - 98

Published: 05 November 2007 Publication History

Abstract

Modern IC designs have reached unparalleled levels of complexity, resulting in more and more bugs discovered after design tape-out However, so far only very few EDA tools for post-silicon debugging have been reported in the literature. In this work we develop a methodology and new algorithms to automate this debugging process. Key innovations in our technique include support for the physical constraints specific to post-silicon debugging and the ability to repair functional errors through subtle modifications of an existing layout. In addition, our proposed post-silicon debugging methodology (FogClear) can repair some electrical errors while preserving functional correctness. Thus, by automating this traditionally manual debugging process, our contributions promise to reduce engineers' debugging effort. As our empirical results show, we can automatically repair more than 70% of our benchmark designs.

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Cited By

Poulos ZBerryhill RAdler JVeneris Ade Rango FRisco Martín J(2016)On simulation-based metrics that characterize the behavior of RTL errorsProceedings of the Summer Computer Simulation Conference10.5555/3015574.3015588(1-8)Online publication date: 24-Jul-2016
https://dl.acm.org/doi/10.5555/3015574.3015588
Berryhill RVeneris ANebel WAtienza D(2015)Automated rectification methodologies to functional state-space unreachabilityProceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition10.5555/2755753.2757138(1401-1406)Online publication date: 9-Mar-2015
https://dl.acm.org/doi/10.5555/2755753.2757138
Gomes AAlves FFerreira RNacif Jde Lima RCunha APlett Cde Oliveira W(2015)Increasing Observability in Post-Silicon Debug Using Asymmetric Omega NetworksProceedings of the 28th Symposium on Integrated Circuits and Systems Design10.1145/2800986.2801011(1-7)Online publication date: 31-Aug-2015
https://dl.acm.org/doi/10.1145/2800986.2801011
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Automating post-silicon debugging and repair
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Information

Published In

cover image ACM Conferences

ICCAD '07: Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design

November 2007

933 pages

ISBN:1424413826

General Chair:
Georges Gielen
ESAT-MICAS, Katholieke Univ. Leuven, Leuven, Belgium

Sponsors

CEDA: Council on Electronic Design Automation
SIGDA: ACM Special Interest Group on Design Automation
IEEE CASS/CANDE
IEEE-CS\DATC: IEEE Computer Society

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IEEE Press

Publication History

Published: 05 November 2007

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ICCAD07

Sponsor:

CEDA
SIGDA
IEEE-CS\DATC

ICCAD07: The International Conference on Computer-Aided Design 2007

November 5 - 8, 2007

California, San Jose

Acceptance Rates

ICCAD '07 Paper Acceptance Rate 139 of 510 submissions, 27%;

Overall Acceptance Rate 457 of 1,762 submissions, 26%

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Cited By

Poulos ZBerryhill RAdler JVeneris Ade Rango FRisco Martín J(2016)On simulation-based metrics that characterize the behavior of RTL errorsProceedings of the Summer Computer Simulation Conference10.5555/3015574.3015588(1-8)Online publication date: 24-Jul-2016
https://dl.acm.org/doi/10.5555/3015574.3015588
Berryhill RVeneris ANebel WAtienza D(2015)Automated rectification methodologies to functional state-space unreachabilityProceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition10.5555/2755753.2757138(1401-1406)Online publication date: 9-Mar-2015
https://dl.acm.org/doi/10.5555/2755753.2757138
Gomes AAlves FFerreira RNacif Jde Lima RCunha APlett Cde Oliveira W(2015)Increasing Observability in Post-Silicon Debug Using Asymmetric Omega NetworksProceedings of the 28th Symposium on Integrated Circuits and Systems Design10.1145/2800986.2801011(1-7)Online publication date: 31-Aug-2015
https://dl.acm.org/doi/10.1145/2800986.2801011
Chandran SSarangi SPanda PMacii E(2013)Space sensitive cache dumping for post-silicon validationProceedings of the Conference on Design, Automation and Test in Europe10.5555/2485288.2485412(497-502)Online publication date: 18-Mar-2013
https://dl.acm.org/doi/10.5555/2485288.2485412
Mitra SBanerjee ADasgupta PRosenstiel WMacii E(2012)Formal methods for ranking counterexamples through assumption miningProceedings of the Conference on Design, Automation and Test in Europe10.5555/2492708.2492937(911-916)Online publication date: 12-Mar-2012
https://dl.acm.org/doi/10.5555/2492708.2492937
De Paula FHu ANahir A(2012)nuTAB-BackSpaceProceedings of the 24th international conference on Computer Aided Verification10.1007/978-3-642-31424-7_37(513-531)Online publication date: 7-Jul-2012
https://dl.acm.org/doi/10.1007/978-3-642-31424-7_37
Veneris AKeng BSafarpour S(2011)From RTL to siliconProceedings of the 16th Asia and South Pacific Design Automation Conference10.5555/1950815.1950884(306-310)Online publication date: 25-Jan-2011
https://dl.acm.org/doi/10.5555/1950815.1950884
Adir AGolubev MLanda SNahir AShurek GSokhin VZiv AStok LDutt NHassoun S(2011)ThreadmillProceedings of the 48th Design Automation Conference10.1145/2024724.2024916(860-865)Online publication date: 5-Jun-2011
https://dl.acm.org/doi/10.1145/2024724.2024916
de Paula FNahir ANevo ZOrni AHu AStok LDutt NHassoun S(2011)TAB-BackSpaceProceedings of the 48th Design Automation Conference10.1145/2024724.2024821(411-416)Online publication date: 5-Jun-2011
https://dl.acm.org/doi/10.1145/2024724.2024821
Adir ANahir AZiv AMeissner CSchumann J(2010)Reaching coverage closure in post-silicon validationProceedings of the 6th international conference on Hardware and software: verification and testing10.5555/1987082.1987092(60-75)Online publication date: 4-Oct-2010
https://dl.acm.org/doi/10.5555/1987082.1987092
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