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Simultaneous input vector selection and dual threshold voltage assignment for static leakage minimization

Published: 05 November 2007 Publication History

Abstract

Dual Vt assignment and input vector control are two tightly coupled leakage reduction techniques. We study how to apply them effectively to a circuit to minimize the static leakage power. We argue that simply combining them in a serial fashion will not reach their full potential in leakage reduction. To show this, we propose a heuristic algorithm that integrates them into a single optimization loop by assigning the value for primary inputs and Vt for logic gates simultaneously. Our algorithm leverages the fact that both input vector and threshold voltage Vt have great impact on a gate's leakage at standby mode and avoids to assign a gate both low Vt and input vector that results high leakage. The selection of input vector and the assignment of Vt are integrated seamlessly through the concepts of leakage observability, worst leakage state, and path factor. The proposed algorithm has a low run time complexity and achieves an average 15% leakage reduction on all the ISCAS and MCNC benchmarks over the serial combination of input vector selection and dual Vt assignment.

References

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Cited By

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  • (2012)Reducing NBTI-induced processor wearout by exploiting the timing slack of instructionsProceedings of the eighth IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis10.1145/2380445.2380514(443-452)Online publication date: 7-Oct-2012
  1. Simultaneous input vector selection and dual threshold voltage assignment for static leakage minimization

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    cover image ACM Conferences
    ICCAD '07: Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
    November 2007
    933 pages
    ISBN:1424413826
    • General Chair:
    • Georges Gielen

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    IEEE Press

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    Published: 05 November 2007

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    ICCAD '07 Paper Acceptance Rate 139 of 510 submissions, 27%;
    Overall Acceptance Rate 457 of 1,762 submissions, 26%

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    • (2012)Reducing NBTI-induced processor wearout by exploiting the timing slack of instructionsProceedings of the eighth IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis10.1145/2380445.2380514(443-452)Online publication date: 7-Oct-2012

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