Tool support for new test criteria on embedded systems

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Tool support for new test criteria on embedded systems: Justitia

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Conference On Ubiquitous Information Management And Communication archive
Proceedings of the 2nd international conference on Ubiquitous information management and communication table of contents

Suwon, Korea

SESSION: Related technologies table of contents

Pages 365-369

Year of Publication: 2008

ISBN:978-1-59593-993-7

Authors

Yuhoon Ki	Ewha Womans Univ., Seoul, Korea
Jooyoung Seo	Ewha Womans Univ., Seoul, Korea
Byungju Choi	Ewha Womans Univ., Seoul, Korea
Kwanghyun La	Samsung Electronics Co., Ltd., Yongin, Korea

Sponsors

SIGKDD: ACM Special Interest Group on Knowledge Discovery in Data
SIGMOD: ACM Special Interest Group on Management of Data

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ACM New York, NY, USA

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ABSTRACT

In this paper, we introduce a testing tool to support new test criteria in interface testing technique. Justitia is an automated testing tool for embedded software that assists an integration testing on software phase during embedded software testing cycle. Justitia has been successfully applied to device driver testing cooperated with Samsung Co.

REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

	1	Ahmed A. Jerraya , Wayne Wolf, Hardware/Software Interface Codesign for Embedded Systems, Computer, v.38 n.2, p.63-69, February 2005 [doi>10.1109/MC.2005.61]
	2	Ahyoung Sung , Byoungju Choi , Seokkyoo Shin, An interface test model for hardware-dependent software and embedded OS API of the embedded system, Computer Standards & Interfaces, v.29 n.4, p.430-443, May, 2007 [doi>10.1016/j.csi.2006.07.002]
	3	Bart, B., Edwin, N. 2003. Testing Embedded Software. Addison-Wesley.
	4	Michael M. Swift , Muthukaruppan Annamalai , Brian N. Bershad , Henry M. Levy, Recovering device drivers, ACM Transactions on Computer Systems (TOCS), v.24 n.4, p.333-360, November 2006 [doi>10.1145/1189256.1189257]
	5	SAMSUNG Electronics Co., Ltd., 2007. Test Model and Automated Test Tool for Mobile AP Device Driver Technical Report.