skip to main content
10.1145/1393921.1394011acmconferencesArticle/Chapter ViewAbstractPublication PagesislpedConference Proceedingsconference-collections
research-article

Noninvasive leakage power tomography of integrated circuits by compressive sensing

Published: 11 August 2008 Publication History

Abstract

We introduce a new methodology for noninvasive post-silicon characterization of the unique static power profile (tomogram) of each manufactured chip. The total chip leakage is measured for multiple input vectors in a linear optimization framework where the unknowns are the gate leakage variations. We propose compressive sensing for fast extraction of the unknowns since the leakage tomogram contains correlations and can be sparsely represented. A key advantage of our approach is that it provides leakage variation estimates even for inaccessible gates. Experiments show that the methodology enables fast and accurate noninvasive extraction of leakage power characteristics.

References

[1]
R. Rao, A. Srivastava, D. Blaauw, and D. Sylvester, "Statistical estimation of leakage current considering inter- and intra-die process variation," in ISLPED, 2003, pp. 84--89.
[2]
P. Friedberg, Y. Cao, J. Cain, R. Wang, J. Rabaey, and C. Spanos, "Modeling within-die spatial correlation effects for process-design co-optimization," in ISQED, 2005, pp. 516--521.
[3]
Y. Cao and L. T. Clark, "Mapping statistical process variations toward circuit performance variability: an analytical modeling approach," in DAC, 2005, pp. 658--663.
[4]
N. Kim, T. Austin, D. Blaauw, T. Mudge, K. Flautner, J. Hu, M. Irwin, M. Kandemir, and N. Vijaykrishnan, "Leakage current Moore's law meets static power," IEEE Computer, vol. 36, no. 12, pp. 68--57, 2003.
[5]
K. Meng and R. Joseph, "Process variation aware cache leakage management," in ISLPED, 2006, pp. 262--267.
[6]
J. Doh, D. Kim, S. Lee, J. Lee, Y. Park, M. Yoo, and J. Kong, "A unified statistical model for inter-die and intra-die process variation," in SISPAD, 2005, pp. 131--134.
[7]
R. Baraniuk, "A lecture on compressive sensing,"IEEE SP Magazine, vol. 24, no. 4, pp. 118--121, 2007.
[8]
E. Candes, "Compressive sampling," in Int. Congress of Mathematics, 2006, pp. 1433--1452.
[9]
W. Zhao, Y. Cao, F. Liu, K. Agarwal, D. Acharyya, and S. N. K. Nowka, "Rigorous extraction of process variations for 65nm CMOS design," in ESSCIRC, 2007, pp. 89--92.
[10]
F. Liu, "A general framework for spatial correlation modeling in VLSI design," in DAC, 2007, pp. 817--822.
[11]
B. Liu, "Spatial correlation extraction via random field simulation and production chip performance regression," in DATE, 2008.
[12]
J. Xiong, V. Zolotov, and L. He, "Robust extraction of spatial correlation," in ISPD, 2006, pp. 2--9.
[13]
K. Agarwal, F. Liu, C. McDowell, S. Nassif, K. Nowka, M. Palmer, D. Acharyya, and J. Plusquellic, "A test structure for characterizing local device mismatches," in Symposium on VLSI Circuits, 2006, pp. 67--68.
[14]
B. Hargreaves, H. Hult, and S. Reda, "Intra-die process variations: How accurately can they be statistically modeled?" in ASP-DAC, 2008, pp. 524--530.
[15]
Y. Alkabani, T. Massey, F. Koushanfar, and M. Potkonjak., "Input vector control for post-silicon leakage current minimization in the presence of manufacturing variability," in DAC, 2008.
[16]
N. K. Jha and S. Gupta, Testing of Digital Systems. Cambridge University Press, 2002.
[17]
Y. Alkabani, F. Koushanfar, N. Kiyavash, and M. Potkonjak, "Trusted integrated circuits: A nondestructive hidden characteristics extraction approach," in Information Hiding, 2008.
[18]
D. Donoho, "Compressed sensing," IEEE Trans. on Info. Theory, vol. 52, no. 4, pp. 1289--1306, 2006.
[19]
T. Taghavi, X. Yang, B.-K. Choi, M. Wang, and M. Sarrafzadeh, "Dragon2005: Large scale mixed-sized placement tool," in ISPD, 2005, pp. 42--47.

Cited By

View all
  • (2022)Deep Compressed Sensing Generation Model for End-to-End Extreme Observation and ReconstructionApplied Sciences10.3390/app12231217612:23(12176)Online publication date: 28-Nov-2022
  • (2018)A Systematic Review of Compressive Sensing: Concepts, Implementations and ApplicationsIEEE Access10.1109/ACCESS.2018.27938516(4875-4894)Online publication date: 2018
  • (2014)Hardware Trojan detection with linear regression based gate-level characterization2014 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)10.1109/APCCAS.2014.7032768(256-259)Online publication date: Nov-2014
  • Show More Cited By

Index Terms

  1. Noninvasive leakage power tomography of integrated circuits by compressive sensing

          Recommendations

          Comments

          Information & Contributors

          Information

          Published In

          cover image ACM Conferences
          ISLPED '08: Proceedings of the 2008 international symposium on Low Power Electronics & Design
          August 2008
          396 pages
          ISBN:9781605581095
          DOI:10.1145/1393921
          Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

          Sponsors

          Publisher

          Association for Computing Machinery

          New York, NY, United States

          Publication History

          Published: 11 August 2008

          Permissions

          Request permissions for this article.

          Check for updates

          Author Tags

          1. leakage current
          2. post-silicon characterization
          3. process variations

          Qualifiers

          • Research-article

          Conference

          ISLPED08
          Sponsor:

          Acceptance Rates

          Overall Acceptance Rate 398 of 1,159 submissions, 34%

          Contributors

          Other Metrics

          Bibliometrics & Citations

          Bibliometrics

          Article Metrics

          • Downloads (Last 12 months)2
          • Downloads (Last 6 weeks)0
          Reflects downloads up to 15 Feb 2025

          Other Metrics

          Citations

          Cited By

          View all
          • (2022)Deep Compressed Sensing Generation Model for End-to-End Extreme Observation and ReconstructionApplied Sciences10.3390/app12231217612:23(12176)Online publication date: 28-Nov-2022
          • (2018)A Systematic Review of Compressive Sensing: Concepts, Implementations and ApplicationsIEEE Access10.1109/ACCESS.2018.27938516(4875-4894)Online publication date: 2018
          • (2014)Hardware Trojan detection with linear regression based gate-level characterization2014 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)10.1109/APCCAS.2014.7032768(256-259)Online publication date: Nov-2014
          • (2013)Low-power resource binding by postsilicon customizationACM Transactions on Design Automation of Electronic Systems10.1145/2442087.244209718:2(1-22)Online publication date: 11-Apr-2013
          • (2012)A Chip Architecture for Compressive Sensing Based Detection of IC TrojansProceedings of the 2012 IEEE Workshop on Signal Processing Systems10.1109/SiPS.2012.33(61-66)Online publication date: 17-Oct-2012
          • (2011)A Unified Framework for Multimodal Submodular Integrated Circuits Trojan DetectionIEEE Transactions on Information Forensics and Security10.1109/TIFS.2010.20968116:1(162-174)Online publication date: 1-Mar-2011
          • (2011)Physical and Mathematical FundamentalsProcess Variations and Probabilistic Integrated Circuit Design10.1007/978-1-4419-6621-6_2(11-67)Online publication date: 8-Oct-2011
          • (2010)Real time emulationsProceedings of the 47th Design Automation Conference10.1145/1837274.1837430(623-624)Online publication date: 13-Jun-2010
          • (2009)Consistency-based characterization for IC Trojan detectionProceedings of the 2009 International Conference on Computer-Aided Design10.1145/1687399.1687426(123-127)Online publication date: 2-Nov-2009
          • (2009)Techniques for Design and Implementation of Secure Reconfigurable PUFsACM Transactions on Reconfigurable Technology and Systems10.1145/1502781.15027862:1(1-33)Online publication date: 1-Mar-2009
          • Show More Cited By

          View Options

          Login options

          View options

          PDF

          View or Download as a PDF file.

          PDF

          eReader

          View online with eReader.

          eReader

          Figures

          Tables

          Media

          Share

          Share

          Share this Publication link

          Share on social media