Synergistic modeling and optimization for nanometer IC design/manufacturing integration
Abstract
Index Terms
- Synergistic modeling and optimization for nanometer IC design/manufacturing integration
Recommendations
DFM reality in sub-nanometer IC design
ASP-DAC '07: Proceedings of the 2007 Asia and South Pacific Design Automation ConferenceThe impact of sub-nanometer (below 90nm) effects on IC designs needs to be clearly understood to ensure that (1) manufacturing variations are considered during design to avoid catastrophic failures, and (2) the expected performance simulated in design ...
Compact Modeling of Variation in FinFET SRAM Cells
Editor's note:FinFET technology is a possible solution to achieve a better power/performance trade-off for SRAM cells. This article provides a comprehensive analysis of the variations in FinFET devices, their impact on SRAM stability, and a statistical ...
Modeling and minimization of PMOS NBTI effect for robust nanometer design
DAC '06: Proceedings of the 43rd annual Design Automation ConferenceNegative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the degradation of NBTI in both static and dynamic operations. Model scalability ...
Comments
Information & Contributors
Information
Published In
![cover image ACM Conferences](/cms/asset/f1a3818f-53f8-4e9e-94d1-7124ffc26698/1404371.cover.jpg)
- General Chair:
- Marcelo Lubaszewski,
- Program Chairs:
- Michel Renovell,
- Rajesh Gupta
Sponsors
Publisher
Association for Computing Machinery
New York, NY, United States
Publication History
Check for updates
Author Tag
Qualifiers
- Tutorial
Conference
Acceptance Rates
Contributors
Other Metrics
Bibliometrics & Citations
Bibliometrics
Article Metrics
- 0Total Citations
- 102Total Downloads
- Downloads (Last 12 months)5
- Downloads (Last 6 weeks)1
Other Metrics
Citations
View Options
Login options
Check if you have access through your login credentials or your institution to get full access on this article.
Sign in