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Software testing techniques for universal building blocks of multimicrosystems

Published: 07 June 1982 Publication History

Abstract

VLSI components testing---in particular, concerning microprocessors---is an essential step during design and production of fault-tolerant complex systems. Actually, an efficient general method should adapt to such different phases as incoming acceptance, periodical testing, maintenance, and even design of self-testing and fault-tolerant units.
Most authors presenting this problem in recent papers advocated functional approaches as the most promising, or even the only possible, ones. In the present paper the problem is analyzed with the purpose of identifying a general criterion capable of leading to semiautomatic test pattern generators through formal definition of the test approach itself. To this end, microprogramming is adopted for creating the functional model of a VLSI programmable device, starting from user-available information.
The approach aims at identifying the presence of faulty behavior error rather than at localizing its physical source fault. This appears to be reasonable, given the testing criterion applications listed above. It will be seen that, although a degree of freedom exists in defining device model and error model, basic characteristics are independent of it and lead to necessary conditions for error coverage.

References

[1]
Thatte, S. M., and J. A. Abraham. "Test generation for general micro-processors architectures." Ninth IEEE Fault Tolerant Computing Symposium, 1979, pp. 203--210.
[2]
Thatte, S. M., and J. A. Abraham. "A methodology for functional level testing of microprocessors." Eighth IEEE Fault Tolerant Computing Symposium, Toulouse, 1978.
[3]
Courtois, B. "On line oriented functional testing of control sections of integrated CPUs." Proceedings of Euromicro 81, Paris, September 1981. Amsterdam: North-Holland, pp. 221--231.
[4]
Sridhar, T., and J. P. Hayes. "A functional approach to testing bit-sliced microprocessors." IEEE Transactions on Computers, C-30 (1981), pp. 563--571.

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AFIPS '82: Proceedings of the June 7-10, 1982, national computer conference
June 1982
857 pages
ISBN:088283035X
DOI:10.1145/1500774
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 07 June 1982

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