Jean François Santucci
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- 11.LF. Santucci, G. Dray, N. Giambiasi, M. Boumrdine, "Methodology to reduce computational cost of behavioral test pattern generation using testability measures "29th Design Automation Conf., 1992, pp. 267-272. Google ScholarDigital Library
- 12.J.F. Sanmcci, G. Dray, M. Boumrdine, N. Giambiasi, "Methods to measure and to enhance the testability of behavioral descriptions of digital circuits," 1st Asian Test Symposium, Hiroshima, 1992, pp. 118- 123.Google Scholar
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- 15.N. Giambiasi, LF. Santucci, A.L. Courbis, "Behavioral test pattem generation for digital circuits," 6th Workshop on new directions of testing, Montreal, May 1992, pp. 77-85.Google Scholar
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Index Terms
- Speed up of behavioral A.T.P.G. using a heuristic criterion
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