skip to main content
10.1145/1837274.1837333acmconferencesArticle/Chapter ViewAbstractPublication PagesdacConference Proceedingsconference-collections
research-article

SCEMIT: a systemc error and mutation injection tool

Published:13 June 2010Publication History

ABSTRACT

As high-level models in C and SystemC are increasingly used for verification and even design (through high-level synthesis) of electronic systems, there is a growing need for compatible error injection tools to facilitate further development of coverage metrics and automated diagnosis. This paper introduces SCEMIT, a tool for the automated injection of errors into C/C++/SystemC models. A selection of 'mutation' style errors are supported, and injection is performed though a plugin interface in the GCC compiler, which minimizes the impact of SCEMIT on existing simulation flows. Experimental injected error detection results are presented for the set of OSCI SystemC Example Models as well as the CHStone C High-Level-Synthesis benchmark set. Aside from demonstrating compatibility with these models, the results show the value of high-level error injection as a coverage measure compared to conventional code coverage measures.

References

  1. G. Martin and G. Smith. High-level synthesis: Past, present, and future. IEEE Des. Test, 26(4):18--25, 2009. Google ScholarGoogle ScholarDigital LibraryDigital Library
  2. M. E. Delamaro and J. C. Maldonado. Proteum/im 2.0: An integrated mutation testing environment. pages 91--101, 2001. Google ScholarGoogle ScholarDigital LibraryDigital Library
  3. M. Hampton and S. Petithomme. Leveraging a commercial mutation analysis tool for research. In TAICPART-MUTATION '07: Proceedings of the Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION, pages 203--209, Washington, DC, USA, 2007. IEEE Computer Society. Google ScholarGoogle ScholarDigital LibraryDigital Library
  4. N. Bombieri, F. Fummi, and G. Pravadelli. A mutation model for the systemc tlm 2.0 communication interfaces. In DATE '08: Proceedings of the conference on Design, automation and test in Europe, pages 396--401, New York, NY, USA, 2008. ACM. Google ScholarGoogle ScholarDigital LibraryDigital Library
  5. G. Beltrame, C. Bolchini, L. Fossati, A. Miele, and D. Sciuto. Resp: a non-intrusive transaction-level reflective mpsoc simulation platform for design space exploration. In ASP-DAC '08: Proceedings of the 2008 Asia and South Pacific Design Automation Conference, pages 673--678, Los Alamitos, CA, USA, 2008. IEEE Computer Society Press. Google ScholarGoogle ScholarDigital LibraryDigital Library
  6. Gcc, the gnu compiler collection. http://gcc.gnu.org/.Google ScholarGoogle Scholar
  7. Open systemc initiative (osci). http://www.systemc.org/.Google ScholarGoogle Scholar
  8. T. A. Budd, R. A. DeMillo, R. J. Lipton, and F. G. Sayward. Theoretical and empirical studies on using program mutation to test the functional correctness of programs. In POPL '80: Proceedings of the 7th ACM SIGPLAN-SIGACT symposium on Principles of programming languages, pages 220--233, New York, NY, USA, 1980. ACM. Google ScholarGoogle ScholarDigital LibraryDigital Library
  9. T. Lv, J. Fan, and X. Li. An efficient observability evaluation algorithm based on factored use-def chains. In Test Symposium, 2003. ATS 2003. 12th Asian, pages 161--166, Nov. 2003.Google ScholarGoogle Scholar
  10. F. Fallah, S. Devadas, and K. Keutzer. Occom: efficient computation of observability-based code coverage metrics for functional verification. In DAC '98: Proceedings of the 35th annual Design Automation Conference, pages 152--157, New York, NY, USA, 1998. ACM. Google ScholarGoogle ScholarDigital LibraryDigital Library
  11. A. J. Offutt, A. Lee, G. Rothermel, R. H. Untch, and C. Zapf. An experimental determination of sufficient mutant operators. ACM Trans. Softw. Eng. Methodol., 5(2):99--118, 1996. Google ScholarGoogle ScholarDigital LibraryDigital Library
  12. H. Agarwal et. al. Design of mutant operators for the c programming language. Technical report, Purdue University, 1989.Google ScholarGoogle Scholar
  13. Plextest. http://www.itregister.com.au/products/plextest.htm.Google ScholarGoogle Scholar
  14. Y. Hara, H. Tomiyama, S. Honda, H. Takada, and K. Ishii. Chstone: A benchmark program suite for practical c-based high-level synthesis. In Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on, pages 1192--1195, May 2008.Google ScholarGoogle ScholarCross RefCross Ref
  15. R. Hierons, M. Harman, and S. Danicic. Using program slicing to assist in the detection of equivalent mutants. Software Testing, Verification and Reliability, 9:233--262, 1999.Google ScholarGoogle ScholarCross RefCross Ref
  16. A. J. Offutt and J. Pan. Automatically detecting equivalent mutants and infeasible paths. Software Testing, Veri and Reliability, 7:165--192, 1997.Google ScholarGoogle ScholarCross RefCross Ref

Index Terms

  1. SCEMIT: a systemc error and mutation injection tool

    Recommendations

    Comments

    Login options

    Check if you have access through your login credentials or your institution to get full access on this article.

    Sign in
    • Published in

      cover image ACM Conferences
      DAC '10: Proceedings of the 47th Design Automation Conference
      June 2010
      1036 pages
      ISBN:9781450300025
      DOI:10.1145/1837274

      Copyright © 2010 ACM

      Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

      Publisher

      Association for Computing Machinery

      New York, NY, United States

      Publication History

      • Published: 13 June 2010

      Permissions

      Request permissions about this article.

      Request Permissions

      Check for updates

      Qualifiers

      • research-article

      Acceptance Rates

      Overall Acceptance Rate1,770of5,499submissions,32%

      Upcoming Conference

      DAC '24
      61st ACM/IEEE Design Automation Conference
      June 23 - 27, 2024
      San Francisco , CA , USA

    PDF Format

    View or Download as a PDF file.

    PDF

    eReader

    View online with eReader.

    eReader