Abstract
Process variation in nanometer technology is becoming an important issue for cutting-edge FPGAs with a multimillion gate capacity. Considering both die-to-die and within-die variations in effective channel length, threshold voltage, and gate oxide thickness, we first develop closed-form models of chip-level FPGA leakage and timing variations. Experiments show that the mean and standard deviation computed by our models are within 3% from those computed by Monte Carlo simulation. We also observe that the leakage and timing variations can be up to 3X and 1.9X, respectively. We then derive analytical yield models considering both leakage and timing variations, and use such models to evaluate the performance of FPGA device and architecture considering process variations. Compared to the baseline, which uses the VPR architecture and device setup based on the ITRS roadmap, device and architecture tuning improves leakage yield by 10.4%, timing yield by 5.7%, and leakage and timing combined yield by 9.4%. We also observe that LUT size of 4 gives the highest leakage yield, LUT size of 7 gives the highest timing yield, but LUT size of 5 achieves the maximum leakage and timing combined yield. To the best of our knowledge, this is the first in-depth study on FPGA architecture and device coevaluation considering process variation.
- Ahmed, E. and Rose, J. 2000. The effect of LUT and cluster size on deep-submicron fpga performance and density. In Proceedings of the ACM International Symposium on Field Programmable Gate Arrays. 3--12. Google ScholarDigital Library
- Anderson, J. H. and Najm, F. N. 2004. Low-Power programmable routing circuitry for fpgas. In Proceedings of the International Conference on Computer-Aided Design. Google ScholarDigital Library
- Babaa, G., Azizi, N., and Najm, F. 2006. An adaptive fpga architecture with process variation compensation and reduced leakage. In Proceedings of the Design Automation Conference. Google ScholarDigital Library
- Betz, V., Rose, J., and Marquardt, A. 1999. Architecture and CAD for Deep-Submicron FPGAs. Kluwer Academic Publishers. Google ScholarDigital Library
- Borkar, S., Narendra, S., Tschanz, T., Keshavarzi, A., and De, V. 2003. Parameter variations and impact on circuits and microarchitecture. In Proceedings of the Design Automation Conference. Google ScholarDigital Library
- Burd, T. and Brodersen, R. 2000. Design issues for dynamic voltage scaling. In Proceedings of the International Symposium on Low Power Electronics and Design. Google ScholarDigital Library
- Chang, H., Zolotov, V., Visweswariah, C., and Naryan, S. 2005. Parameterized block-based statistical timing analysis with non-Gaussian parameters and nonlinear delay functions. In Proceedings of the Design Automation Conference. Google ScholarDigital Library
- Cheng, L., Wong, P., Li, F., Lin, Y., and He, L. 2005. Device and architecture co-optimization for fpga power reduction. In Proceedings of the Design Automation Conference. Google ScholarDigital Library
- Cheng, L., Wong, P., Li, F., Lin, Y., and He, L. 2007. Device and architecture co-optimization for fpga power reduction. IEEE Trans. Comput.-Aided Des. Integr. Circ. Syst. 26, 1211--1221. Google ScholarDigital Library
- Cheng, L., Lin, Y., and He, L. 2008. Tracebased framework for concurrent development of process and fpga architecture considering process variation and reliability. In Proceedings of the ACM International Symposium on Field Programmable Gate Arrays. Google ScholarDigital Library
- Cheng, L., Gong, F., Xu, W., Xiong, J., He, L., and Sarrafzadeh, M. 2011. Fourier series approximation for max operation in non-Gaussian and quadratic statistical static timing analysis. IEEE Trans. VLSI Syst. 19, 12.Google Scholar
- Degalahal, V. and Tuan, T. 2005. Methodology for high level estimation of fpga power consumption. In Proceedings of the Asia and South Pacific Design Automation Conference. Google ScholarDigital Library
- Dorrance, R., Ren, F., Toriyama, Y., Amin, A., Yang, K., and Markovic, D. 2012. Scalability and design space analysis of a 1T-1MTJ memory cell for stt-rams. IEEE Trans. Electron. Devices 59, 4, 878--887.Google ScholarCross Ref
- Drego, N., Chandrakasan, A., and Boning, D. 2009. Lack of spatial correlation in mosfet threshold voltage variation and implications for voltage scaling. IEEE Trans. Semiconduct. Manufact. 22, 2, 1475--1485.Google ScholarCross Ref
- Friedberg, P., Cao, Y., Cain, J., Wang, R., Rabaey, J., and Spanos, C. 2005. Modeling within-die spatial correlation effects for process design co-optimization. In Proceedings of the International Symposium on Low Power Electronics and Design.Google Scholar
- Gattiker, A., Nassif, S., Dinakar, R., and Long, C. 2001. Timing yield estimation from static timing analysis. In Proceedings of the International Symposium on Quality of Electronic Design. Google ScholarDigital Library
- Gayasen, A., Lee, K., Vijaykrishnan, N., Kandemir, M., Irwin, M. J., and Tuan, T. 2004a. A dual-vdd low power fpga architecture. In Proceedings of the International Conference on Field Programmable Logic and its Application.Google Scholar
- Gayasen, A., Tsai, Y., Vijaykrishnan, N., Kandemir, M., Irwin, M. J., and Tuan, T. 2004b. Reducing leakage energy in fpgas using region-constrained placement. In Proceedings of the ACM International Symposium on Field Programmable Gate Arrays. Google ScholarDigital Library
- Gupta, P., Kahng, A., Sharma, P., and Sylvester, D. 2006. Gate-Length biasing for runtime-leakage control. IEEE Trans. Comput.-Aided Des. Integr. Circ. Syst. 25, 1475--1485. Google ScholarDigital Library
- International Technology Roadmap for Semiconductors. 2002. http://public.itrs.net/.Google Scholar
- International Technology Roadmap for Semiconductors. 2005. A user’s guide to MASTAR4. http://www.itrs.net/models.html.Google Scholar
- Le, J., Li, X., and Pileggi, L. T. 2004. Stac: Statistical timing analysis with correlation. In Proceedings of the Design Automation Conference. Google ScholarDigital Library
- Lemieux, G. G. and Brown, S. D. 1993. A detailed router for allocating wire segments in field programmable gate arrays. In Proceedings of the ACM Physical Design Workshop.Google Scholar
- Li, F. and He, L. 2005. Power modeling and characteristics of field programmable gate arrays. IEEE Trans. Comput.-Aided Des. Integr. Circ. Syst. 24, 11, 1712--1724. Google ScholarDigital Library
- Li, F., Chen, D., He, L., and Cong, J. 2003. Architecture evaluation for power-efficient fpgas. In Proceedings of the ACM International Symposium on Field Programmable Gate Arrays. Google ScholarDigital Library
- Li, F., Lin, Y., and He, L. 2004a. Vdd programmability to reduce fpga interconnect power. In Proceedings of the Design Automation Conference. Google ScholarDigital Library
- Li, F., Lin, Y., and He, L. 2004b. FPGA power reduction using configurable dual-vdd. In Proceedings of the Design Automation Conference. Google ScholarDigital Library
- Li, F., Lin, Y., He, L., and Cong, J. 2004c. Low-Power fpga using pre-defined dual-vdd/dual-vt fabrics. In Proceedings of the ACM International Symposium on Field Programmable Gate Arrays. Google ScholarDigital Library
- Lin, Y. and He, L. 2007. Device and architecture concurrent optimization for fpga transient soft error rate. In Proceedings of the International Conference on Computer-Aided Design. Google ScholarDigital Library
- Lin, Y., Li, F., and He, L. 2005a. Routing track duplication with fine-grained power-gating for fpga interconnect power reduction. In Proceedings of the Asia and South Pacific Design Automation Conference. Google ScholarDigital Library
- Lin, Y., Li, F., and He, L. 2005b. Circuits and architectures for vdd programmable fpgas. In Proceedings of the ACM International Symposium on Field Programmable Gate Arrays.Google Scholar
- Mani, M., Devgan, A., and Orshansky, M. 2005. An efficient algorithm for statistical minimization of total power under timing yield constraints. In Proceedings of the Design Automation Conference. Google ScholarDigital Library
- Najm, F. N. and Menezes, N. 2004. Statistical timing analysis based on a timing yield model. In Proceedings of the Design Automation Conference. Google ScholarDigital Library
- Orshansky, M. and Bandyopadhyay, A. 2004. Fast statistical timing analysis with arbitrary delay correlations. In Proceedings of the Design Automation Conference. Google ScholarDigital Library
- Poon, K., Yan, A., and Wilton, S. 2002. A flexible power model for fpgas. In Proceedings of the 12th International Conference on Field Programmable Logic and Applications. Google ScholarDigital Library
- Raj, S., Vrudhula, S. B., and Wang, J. 2004. A methodology to improve timing yield in the presence of process variations. In Proceedings of the Design Automation Conference. Google ScholarDigital Library
- Rao, R., Devgan, A., Blaauw, D., and Sylvester, D. 2004. Parametric yield estimation considering leakage variability. In Proceedings of the Design Automation Conference. Google ScholarDigital Library
- Ren, F. and Markovic, D. 2010. True energy-performance analysis of the mtj-based logic-in-memory architecture (1-bit full adder). IEEE Trans. Electron. Devices 57, 5, 1023--1028.Google ScholarCross Ref
- Rose, J., Francis, R., Lewis, D., and Chow, P. 1990. Architecture of field programmable gate arrays: The effect of logic functionality on area efficiency. IEEE J. Solid State Circ. 25, 5, 1217--1225.Google ScholarCross Ref
- Singh, S., Rose, J., Chow, P., and Lewis, D. 1992. The effect of logic block architecture on fpga performance. IEEE J. Solid State Circ. 27, 3, 281--287.Google ScholarCross Ref
- Srivastava, A., Shah, S. S., Agarwal, K. B., Sylvester, D. M., Blaauw, D., and Director, S. 2005. Impact of process variations on power. In Proceedings of the Design Automation Conference.Google Scholar
- Tuan, T. and Lai, B. 2003. Leakage power analysis of a 90nm fpga. In Proceedings of the IEEE Custom Integrated Circuits Conference.Google Scholar
- Wang, A., Chandrakasan, A., and Kosonocky, S. 2002. Optimal supply and threshold scaling for subthreshold cmos circuits. In Proceedings of the IEEE Computer Society Annual Symposium on VLSI. Google ScholarDigital Library
- Wong, H., Cheng, L., Lin, Y., and He, L. 2005. FPGA device and architecture evaluation considering process variations. In Proceedings of the International Conference on Computer-Aided Design. Google ScholarDigital Library
- Xilinx Corporation. 2002. Virtex-II 1.5v platform fpga complete data sheet. http://www.mtl.mit.edu/Courses/6.111/labkit/datasheets/virtex2datasheet.pdf.Google Scholar
- Xu, W., Wang, J., Hu, Y., Lee, J.-Y., Gong, F., He, L., and Sarrafzadeh, M. 2011. In-Place fpga retiming for mitigation of variational single-event transient faults. IEEE Trans. Circ. Syst. 58, 6, 1372--1381.Google Scholar
- Zhan, Y., Strojwas, A. J., Li, X., Pileggi, L. T., Newmark, D., and Sharma, M. 2005. Correlation-Aware statistical timing analysis with non-Gaussian distributions. In Proceedings of the Design Automation Conference. Google ScholarDigital Library
- Zhang, L., Chen, W., Hu, Y., Gubner, J. A., and Cheng, C. C.-P. 2005. Correlation-Preserved non-Gaussian statistical timing analysis with quadratic timing model. In Proceedings of the Design Automation Conference. Google ScholarDigital Library
- Zhang, S., Waso, V., and Banerjee, K. 2004. A probabilistic framework to estimate full-chip subthreshold leakage power distribution considering within-die and die-to-die p-t-v variations. In Proceedings of the International Symposium on Low Power Electronics and Design. Google ScholarDigital Library
- Zhao, W. and Cao, Y. 2007. Rigorous extraction of process variations for 65nm cmos design. In Proceedings of the European Solid-State Circuits Conference.Google Scholar
- Zhao, W., Liu, F., Agarwal, K., Acharyya, D., Nassif, S., and K. Nowka, Y. C. 2007. Rigorous extraction of process variations for 65nm cmos design. In Proceedings of the Solid State Device Research Conference.Google Scholar
Index Terms
- Statistical Timing and Power Optimization of Architecture and Device for FPGAs
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