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Hierarchical electromigration reliability diagnosis for VLSI interconnects

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Published:01 June 1996Publication History
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References

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          cover image ACM Conferences
          DAC '96: Proceedings of the 33rd annual Design Automation Conference
          June 1996
          839 pages
          ISBN:0897917790
          DOI:10.1145/240518

          Copyright © 1996 ACM

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          • Published: 1 June 1996

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          DAC '96 Paper Acceptance Rate142of377submissions,38%Overall Acceptance Rate1,770of5,499submissions,32%

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